US2007178232A1PendingUtilityA1
Tape compositions for the deposition of electronic features
Est. expiryOct 19, 2021(expired)· nominal 20-yr term from priority
Inventors:Toivo T. KodasMark J. Hampden-SmithKarel VanheusdenHugh DenhamAaron D. StumpAllen B. SchultPaolina AtanassovaKlaus Kunze
H10D 84/01H05K 3/207B33Y 80/00H05K 3/046B32B 27/00B05D 5/12B33Y 10/00
47
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Claims
Abstract
Precursor compositions in the form of a tape that can be transferred to a substrate and converted to an electronic feature at a relatively low temperature, such as not greater than about 200° C. The tape composition can be disposed on a carrier to form a ribbon structure that is flexible and can be handled in a variety of industrial processes.
Claims
exact text as granted — not AI-modified1 . A process for forming a solar cell conductive feature, comprising:
(a) providing a ribbon structure comprising a tape composition on a carrier, the tape composition comprising metallic nanoparticles; (b) transferring the tape composition from the carrier to a substrate in a pattern of features; and (c) heating the tape composition to form the solar cell conductive feature on the substrate.
2 . The process of claim 1 , wherein the heating comprises heating the tape composition to a temperature not greater than 1000° C. to form the solar cell conductive feature on the substrate.
3 . The process of claim 1 , wherein the heating comprises heating the tape composition to a temperature not greater than 300° C. to form the solar cell conductive feature on the substrate.
4 . The process of claim 1 , wherein the substrate has a softening point of not greater than about 350° C.
5 . The process of claim 1 , wherein the substrate has a softening point of not greater than about 250° C.
6 . The process of claim 1 , wherein the substrate comprises a glass.
7 . The process of claim 1 , wherein the conductive feature comprises a set of finger lines and collector lines deposited essentially at a right angle to the finger lines.
8 . The process of claim 7 , wherein either or both the parallel finger lines or the collector lines have a minimum feature size of not greater than 200 μm.
9 . The process of claim 7 , wherein either or both the parallel finger lines or the collector lines have a minimum feature size of not greater than 100 μm.
10 . The process of claim 7 , wherein either or both the parallel finger lines or the collector lines have a minimum feature size of not greater than 75 μm.
11 . The process of claim 7 , wherein either or both the parallel finger lines or the collector lines have a minimum feature size of not greater than 50 μm.
12 . The process of claim 7 , wherein either or both the parallel finger lines or the collector lines have a minimum feature size of not greater than 25 μm.
13 . The process of claim 1 , wherein the conductive feature has a thickness greater than about 1 μm.
14 . The process of claim 1 , wherein the conductive feature has a thickness greater than about 5 μm.
15 . The process of claim 1 , wherein the tape composition further comprises glass particles.
16 . The process of claim 15 , wherein the glass particles have an average particle size less than 0.5 μm.
17 . The process of claim 1 , wherein the metallic nanoparticles comprise a metal selected from the group consisting of silver, palladium, copper, gold, platinum and nickel.
18 . The process of claim 1 , wherein the metallic nanoparticles comprise metal oxide nanoparticles.
19 . The process of claim 1 , wherein the tape composition further comprises metal oxide particles.
20 . The process of claim 19 , wherein the metal oxide particles comprise silica.
21 . The process of claim 19 , wherein the metal oxide particles comprise glass.
22 . The process of claim 1 , wherein the conductive feature comprises a transparent conductive feature.
23 . The process of claim 1 , wherein the conductive feature comprises indium-tin oxide or antimony-tin oxide.
24 . The process of claim 1 , wherein the metallic nanoparticles have an average particle size of from about 10 to 80 nm.
25 . The process of claim 1 , wherein the metallic nanoparticles have an average particle size of not greater than 100 nm.
26 . The process of claim 25 , wherein the metallic nanoparticles comprise a cap or coating thereon.
27 . The process of claim 26 , wherein the cap or coating comprises an inorganic cap or coating.
28 . The process of claim 26 , wherein the cap or coating comprises silica.
29 . The process of claim 26 , wherein the cap or coating comprises glass.
30 . The process of claim 26 , wherein the cap or coating comprises an organic cap or coating.
31 . The process of claim 26 , wherein the cap or coating comprises a polymer.
32 . The process of claim 26 , wherein the cap or coating comprises an intrinsically conductive polymer, a sulfonated perfluorohydrocarbon polymer, polystyrene, polystyrene/methacrylate, sodium bis(2-ethylhexyl) sulfosuccinate, tetra-n-octyl-ammonium bromide or an alkane thiolate.
33 . The process of claim 26 , wherein the cap or coating comprises PVP.
34 . The process of claim 1 , wherein conductive feature has a conductivity that is no less than 10 percent the conductivity of the equivalent pure metal.
35 . The process of claim 1 , wherein the conductive feature has a resistivity that is not greater than 4 times the resistivity of the bulk conductor.
36 . The process of claim 1 , wherein the conductive feature has a resistivity that is not greater than 2 times the resistivity of the bulk conductor.
37 . The process of claim 1 , wherein the conductive feature is resistant to solder leaching.
38 . The process of claim 1 , wherein the conductive feature comprises a metal-glass composition.Join the waitlist — get patent alerts
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