US2007158302A1PendingUtilityA1
Systems and methods for gas assisted resist removal
Individually held — no corporate assignee on recordPriority: Aug 16, 2000Filed: Feb 27, 2007Published: Jul 12, 2007
Est. expiryAug 16, 2020(expired)· nominal 20-yr term from priority
Inventors:Terry L. Gilton
H10P 70/18H10P 72/0424H10P 50/287H10P 72/0448G03F 7/427Y10S438/948G03F 7/423
54
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Claims
Abstract
A system for removing resist from a substrate is configured to apply an ozonated resist stripper to a resist that is to be removed, as well as to direct another gas toward the resist. In a resist removal method, a resist stripper that includes ozone is applied to a resist and another gas is directed toward the resist. Direction of a gas other than ozone at least partially toward the resist may facilitate removal of the resist, such as by causing movement in the resist stripper.
Claims
exact text as granted — not AI-modified1 . A system for removing resist from a substrate, comprising:
a source of resist stripper, the resist stripper comprising ozone; an applicator in communication with the source and configured to apply a quantity of the resist stripper to the resist; a gas source of at least one gas other than ozone; and a gas output element in communication with the gas source and configured to direct the at least one gas at least partially toward the resist.
2 . The system of claim 1 , wherein the at least one gas comprises nitrogen.
3 . The system of claim 1 , wherein the at least one gas includes at least one gas that facilitates removal of the resist from the substrate.
4 . The system of claim 3 , wherein the at least one gas comprises gaseous hydrochloric acid.
5 . The system of claim 1 , wherein the applicator is configured to at least partially coat the resist with the resist stripper.
6 . The system of claim 5 , wherein the applicator is configured to spray the quantity of the resist stripper onto at least a portion of the resist.
7 . The system of claim 1 , wherein the applicator comprises the quantity of the resist stripper within which at least a portion of a surface of the resist is immersible.
8 . The system of claim 1 , wherein the gas output element is positioned and configured to effect movement of the resist stripper laterally over a surface of the substrate.
9 . The system of claim 1 , wherein the gas output element is located and configured to thin a layer of the resist disposed over a surface of the substrate.
10 . The system of claim 1 , wherein the gas output element is configured and located so as to direct the at least one gas in substantially the same direction as a direction in which the applicator is located and configured to apply the resist stripper.
11 . The system of claim 1 , wherein the gas output element is configured to direct the at least one gas in a different direction from the direction in which the applicator is located and configured to apply the resist stripper.
12 . The system of claim 1 , further comprising:
a support structure configured to orient a plane of the substrate nonhorizontally.
13 . The system of claim 1 , further comprising:
a support structure configured to rotate the substrate about an axis perpendicular to a plane thereof.
14 . A method for facilitating the removal of reactants from a resist stripper during removal thereof from a substrate, comprising:
applying a resist stripper comprising ozone to the resist; and directing a quantity of at least one gas other than ozone at least partially toward the resist stripper.
15 . The method of claim 14 , wherein applying comprises at least partially coating the resist with the resist stripper.
16 . The method of claim 14 , wherein applying comprises spraying the resist stripper onto the resist.
17 . The method of claim 14 , wherein applying comprises immersing at least a portion of a surface of the resist within a quantity of the resist stripper.
18 . The method of claim 14 , wherein directing is effected from substantially the same location as a location from which applying is effected.
19 . The method of claim 14 , wherein directing is effected from a different location than a location from which applying is effected.
20 . The method of claim 14 , wherein directing comprises directing nitrogen at least partially toward the resist stripper.
21 . The method of claim 14 , wherein directing comprises directing at least one gas that facilitates removal of the resist at least partially toward the resist stripper.
22 . The method of claim 21 , further comprising directing hydrochloric acid at least partially toward the resist stripper.
23 . The method of claim 14 , wherein directing the at least one gas comprises effecting movement of the resist stripper laterally over the substrate.
24 . The method of claim 14 , wherein directing the at least one gas comprises thinning the resist stripper.
25 . The method of claim 14 , wherein applying and directing remove a hard-baked resist at a rate of at least about 8,000 angstroms per second.
26 . The method of claim 14 , wherein applying and directing remove a hard-baked resist at a rate of about 8,000 to about 12,000 angstroms per second.
27 . The method of claim 14 , further comprising:
orienting a plane of the substrate nonhorizontally.
28 . The method of claim 14 , further comprising:
rotating the substrate about an axis perpendicular to a plane thereof.Join the waitlist — get patent alerts
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