US2007146674A1PendingUtilityA1
Advanced Illumination System for Use in Microlithography
Est. expiryJun 11, 2022(expired)· nominal 20-yr term from priority
G03F 7/70183G03F 7/70091G03F 7/20G03F 7/70158
53
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Claims
Abstract
A system for microlithography comprises an illumination source; an illumination optical system including, in order from an objective side, (a) a first diffractive optical element that receives illumination from the illumination source, (b) a zoom lens, (c) a second diffractive optical element, (d) a condenser lens, (e) a relay lens, and (f) a reticle, and a projection optical system for imaging the reticle onto a substrate, wherein the system for microlithography provides a zoomable numerical aperture.
Claims
exact text as granted — not AI-modified1 - 32 . (canceled)
33 . A system for microlithography comprising:
an illumination source; an illumination optical system including, in order from an objective side:
(a) a first diffractive optical element that receives illumination from said illumination source;
(b) a second diffractive optical element;
(c) a condenser lens; and
(d) a relay lens, wherein an illumination field between the condenser and the relay lens are continuously adjustable.Join the waitlist — get patent alerts
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