US2007131055A1PendingUtilityA1
Thermal interface material and semiconductor device incorporating the same
Est. expiryDec 9, 2025(expired)· nominal 20-yr term from priority
B22F 2998/00H10W 90/736H10W 90/724H10W 72/877H10W 72/353H10W 72/352H10W 72/325H10W 40/70H10W 40/251
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Claims
Abstract
A semiconductor device includes a heat source, a heat-dissipating component for dissipating heat generated by the heat source, and thermal interface material filled in a space formed between the heat source and the heat-dissipating component. The thermal interface material includes 50% to 90% in weight of at least one metal powders having an average particle size of 2 to 20 μm and selected from the group consisting of spherical tin powders and powders of memory alloy, and 5% to 15% in weight of silicone oil having a viscosity from 50 tO 50,000 cs at 25° C.
Claims
exact text as granted — not AI-modified1 . A thermal interface material comprising:
5% to 15% in weight of base oil; and 50% to 90% in weight of fillers filled in the base oil, wherein the fillers have an average particle size of 2 to 20 μm and are selected from the group consisting of spherical tin powders and powders made of memory alloys.
2 . The thermal interface material as described in claim 1 , wherein the base oil has a viscosity from 50 to 50,000 cs at 25° C.
3 . The thermal interface material as described in claim 1 , wherein the base oil is silicone oil.
4 . The thermal interface material as described in claim 3 , wherein a major component of the silicone oil is organopolysiloxane.
5 . The thermal interface material as described in claim 4 , wherein the organopolysiloxane is dimethylpolysiloxane.
6 . The thermal interface material as described in claim 1 , wherein the ratio of the spherical tin powders to the powders of memory alloy is in a range of 1:1 to 1:10 in weight.
7 . The thermal interface material as described in claim 1 , wherein the memory alloy is Ni—Ti alloy.
8 . The thermal interface material as described in claim 1 , wherein the memory alloy is Co—Zn 13 Al alloy.
9 . The thermal interface material as described in claim 1 , further comprising 0% to 35% in weight of oxide powders.
10 . The thermal interface material as described in claim 9 , wherein an average particle size of the oxide powders is in the range of 0.1 to 5 μm.
11 . The thermal interface material as described in claim 9 , wherein the oxide powders are selected from the group consisting of zinc oxide and alumina powders.
12 . A semiconductor device comprising:
a heat source; a heat-dissipating component for dissipating heat generated by the heat source; and a thermal interface material filled in a space formed between the heat source and the heat-dissipating component, the thermal interface material comprising: 50% to 90% in weight of at least one metal powders having an average particle size of 2 to 20 μm and selected from the group consisting of spherical tin powders and powders made of memory alloy; 5% to 15% in weight of silicone oil having a viscosity from 50 to 50,000 cs at 25° C.; and 0% to 35% in weight of at least one oxide powders having an average particle size of 0.1 to 5 μm and selected from the group consisting of zinc oxide and alumina powders.
13 . The semiconductor device as described in claim 12 , wherein the memory alloy is one of Ni—Ti alloy and Co—Zn—Al alloy.
14 . The semiconductor device as described in claim 12 , wherein a major component of the silicone oil is organopolysiloxane.
15 . The semiconductor device as described in claim 14 , wherein the organopolysiloxane is dimethylpolysiloxane.
16 . The semiconductor device as described in claim 12 , wherein a ratio of the spherical tin powders to the powders of memory alloy is in a range of 1:1 to 1:10 in weight.
17 . A thermal interface material adapted for being applied between a heat-generating electronic component and a heat-dissipating component, comprising:
a base oil; and fillers filled in the base oil, wherein the fillers comprise at least one of tin powders and powders of memory alloy.
18 . The thermal interface material as described in claim 17 , wherein the tin powders and the powders of memory alloy each have a spherical shape before the thermal interface material is applied between the heat-generating electronic component and the heat-dissipating component.
19 . The thermal interface material as described in claim 18 , wherein the tin powders and powders of memory alloy each have an elliptical shape after the thermal interface material is applied between the heat-generating electronic component and the heat-dissipating component.
20 . The thermal interface material as described in claim 19 , wherein the fillers further comprise oxide powders.Join the waitlist — get patent alerts
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