Calibration pattern and calibration jig

Abstract

In a high frequency circuit property measurement method, prior to property measurements of a high frequency circuit with RF measurement probe heads, RF measurement probe head are calibrated using a calibration pattern comprising a signal line having a characteristic impedance and extending on a dielectric substrate, a first GND pad having one end disposed close to and at an interval from a first end of the signal line, a second GND pad having one end disposed close to and at an interval from a second end of the signal line, and a conductor electrically coupling the first GNU pad to the second GND pad.

1 . (canceled)  
   
   
       2 . A calibration pattern comprising: 
 a substrate;    a signal line having characteristic impedance and extending to first and second on said substrate;    a first constant potential line having a first end disposed close to and at a predetermined interval from said first end of said signal line;    a second constant potential line having a first end disposed close to and at a predetermined interval from the second end of said signal line; and    a conductor electrically coupling said first constant potential line to said second constant potential line.    
   
   
       3 . The calibration pattern according to  claim 2 , wherein the first end of each of said first and second constant potential lines is disposed in a prolongation direction of said signal line.  
   
   
       4 . The calibration pattern according to  claim 2 , wherein the first ends of said first and second constant potential lines are disposed along side portions of said signal line, respectively, and confront each others with said signal line therebetween.  
   
   
       5 . The calibration pattern according to  claim 4 , further comprising a third constant potential line having a first end confronting face-to-face the first end of said first constant potential line with said signal line therebetween and having a second end electrically coupled to conductor to which seconds ends of said first and second constant potential lines are electrically coupled.  
   
   
       6 . The calibration pattern according to  claim 5 , further comprising a fourth constant potential line having a first end confronting face-to-face the first end of said second constant potential line with said signal line therebetween and having a second end electrically coupled to said conductor to which the second ends of said first and second constant potential lines are electrically coupled.  
   
   
       7 . A calibration jig comprising: 
 a calibration pattern comprising, 
 a substrate,  
 a signal line having a characteristic impedance and extending to first and second ends on said substrates,  
 a first constant potential line having a first end disposed close to and at a predetermined interval from said first end of the signal line,  
 a second constant potential line having a first end disposed close to and at a predetermined interval from the second end of said signal line, and  
 a conductor electrically coupling said first constant potential line to said second constant potential line; and  
   a dielectric substrate having a recessed portions in a surface for exchangeably mounting said calibration pattern in the recess.