US2007095285A1PendingUtilityA1
Apparatus for cyclical depositing of thin films
Individually held — no corporate assignee on recordPriority: Jan 25, 2002Filed: Dec 19, 2006Published: May 3, 2007
Est. expiryJan 25, 2022(expired)· nominal 20-yr term from priority
Inventors:Randhir P. S. ThakurAlfred MakMing XiWalter GlennAhmad KhanAyad A. Al-ShaikhAvgerinos V. GelatosSalvador P. Umotoy
H10P 72/0462C23C 16/45544C23C 16/4412C23C 16/452C23C 16/45536C23C 16/45565C23C 16/45582H01J 37/32009H01J 37/32091H01J 37/3244H01J 37/32834
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Claims
Abstract
An apparatus for cyclical depositing of thin films on semiconductor substrates, comprising a process chamber having a gas distribution system with separate paths for process gases and an exhaust system synchronized with operation of valves dosing the process gases into a reaction region of the chamber.
Claims
exact text as granted — not AI-modified1 . A gas distribution system for providing at least two gases to a processing chamber, comprising:
a lid assembly and a manifold comprising a first isolated flow path and a second isolated flow path, wherein the first isolated flow path includes an outlet in fluid communication with a central gas channel having a diameter that radially expands towards a showerhead coupled to the lid assembly; a first high speed valve coupled to the manifold and in fluid communication with the first isolated flow path and a second high speed valve coupled to the manifold and in fluid communication with the second isolated flow path; and a valved exhaust system in communication with and at least partially synchronized with the operation of at least the first high speed valve.
2 . The apparatus of claim 1 , wherein first high speed valve and the second high speed valve is configured to pulse a precursor gas and continually flow a purge gas or a carrier gas.
3 . The apparatus of claim 1 , wherein a plasma generator is coupled to the processing chamber.
4 . The apparatus of claim 3 , wherein the plasma generator is a radio frequency source.
5 . The apparatus of claim 3 , wherein the plasma generator is a microwave source.
6 . The apparatus of claim 1 , wherein the showerhead comprises a central region having a plurality of slotted openings and an outer region having a plurality of apertures surrounding the plurality of slotted openings.
7 . The apparatus of claim 6 , wherein the slotted openings are positioned to direct a substantially vertical gas flow along the axis of the central gas channel to a partially horizontal gas flow that is at least partially orthogonal to the axis of the central gas channel.
8 . The apparatus of claim 1 , wherein a dispersion plate is positioned below the showerhead.
9 . A gas distribution system for providing at least two gases to a processing region in a processing chamber, comprising:
a valve assembly comprising a first high speed valve and a second high speed valve coupled to a manifold, wherein the manifold comprises:
a first isolated flow path; and
a second isolated flow path, wherein each of the first and second isolated flow paths comprises at least one precursor gas inlet;
a lid assembly, comprising:
a showerhead coupled to a lid plate, wherein the showerhead comprises a central region having slotted openings and an outer region having a plurality of apertures; and
a central gas channel passing through the lid plate, wherein the central gas channel includes an upper portion and a lower portion having an increasing diameter towards the showerhead; and
a valved exhaust system in communication with the operation of the first high speed valve and the second high speed valve, wherein each isolated flow path receives a precursor gas and a carrier gas that is pulsed to the processing region by the first high speed valve and the second high speed valve.
10 . The apparatus of claim 9 , wherein a dispersion plate is positioned below the slotted openings.
11 . The apparatus of claim 10 , wherein the dispersion plate is fixed to the showerhead.
12 . The apparatus of claim 10 , wherein the dispersion plate is integral to the showerhead.
13 . The apparatus of claim 9 , wherein the slotted openings are positioned to direct a substantially vertical gas flow along the axis of the central gas channel to a partially horizontal gas flow that is at least partially orthogonal to the axis of the central gas channel.
14 . The apparatus of claim 9 , wherein a plasma generator is coupled to the processing chamber.
15 . The apparatus of claim 14 , wherein the plasma generator is a radio frequency source.
16 . The apparatus of claim 14 , wherein the plasma generator is a microwave source.
17 . A gas distribution system for providing at least two gases to a processing region in a processing chamber, comprising:
a valve assembly comprising a first high speed valve and a second high speed valve coupled to a manifold, wherein the manifold comprises:
a first isolated flow path; and
a second isolated flow path, wherein each of the first and second isolated flow paths comprises at least one precursor gas inlet;
a plasma source coupled to the at least one precursor inlet; a lid assembly, comprising:
a showerhead coupled to a lid plate, wherein the showerhead comprises a central region having slotted openings and an outer region having a plurality of apertures; and
a central gas channel passing through the lid plate, wherein the central gas channel includes an upper portion and a lower portion having an increasing diameter towards the showerhead; and
a valved exhaust system in communication with the operation of the first high speed valve and the second high speed valve, wherein each isolated flow path receives a precursor gas and a carrier gas that is pulsed to the processing region by the first high speed valve and the second high speed valve.
18 . The apparatus of claim 17 , wherein a dispersion plate is positioned below the slotted openings.
19 . The apparatus of claim 18 , wherein the dispersion plate is fixed to the showerhead.
20 . The apparatus of claim 17 , wherein the slotted openings are positioned to direct a substantially vertical gas flow along the axis of the central gas channel to a partially horizontal gas flow that is at least partially orthogonal to the axis of the central gas channel.Join the waitlist — get patent alerts
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