US2007051891A1PendingUtilityA1

Systems and methods for inspecting coatings

Assignee: SAITO KOZOPriority: Jul 29, 2003Filed: Oct 30, 2006Published: Mar 8, 2007
Est. expiryJul 29, 2023(expired)· nominal 20-yr term from priority
G01N 25/72
49
PatentIndex Score
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Claims

Abstract

A system for detecting defects in paint coatings includes a temperature manipulation apparatus configured to change the temperature of a surface and a coating applied to the surface. The system may further include an infrared sensor for measuring the change in temperature of the surface and coating and a processor to compare the measured change in temperature of the surface and coating to an expected change of temperature in order to determine anomalies in the coatings.

Claims

exact text as granted — not AI-modified
1 . A system for detecting defects in coatings comprising: 
 a) a temperature manipulation apparatus configured to change the temperature of a surface;    b) an infrared sensor configured to measure the change in temperature of said surface; and    c) a processor configured to compare said measured change in temperature of said surface to an expected change of temperature.    
   
   
       2 . The system of  claim 1 , wherein said system further comprises an application apparatus configured to apply a coating to said surface.  
   
   
       3 . The system of  claim 1 , wherein said system further comprises multiple coating stations configured to apply a coating to said surface.  
   
   
       4 . The system of  claim 1 , wherein said surface comprises a coating.  
   
   
       5 . The system of  claim 1 , wherein said system further comprises a plurality of coating stations having associated sensors.  
   
   
       6 . The system of  claim 1 , wherein said processor is further configured to compare radiation emitted by said surface to a thermal signature and an acceptable preexisting model profile.  
   
   
       7 . The system of  claim 1 , wherein said processor is further configured to generate signals for transmission to an application apparatus to correct a detected defect.  
   
   
       8 . The system of  claim 1 , wherein said expected change of temperature may be calculated based upon a known thermal effusivity value for said surface and said defect.

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