Structure of an ultra-thin wafer level stack package
Abstract
A structure of an ultra-thin wafer level stack package is provided. A method for manufacturing the structure includes providing a first wafer having a plurality of base chips thereon, selectively binding the first wafer to a second substrate, lapping the first wafer to reduce its thickness, dicing the lapped first wafer, bonding a plurality stack chips to each base chip and packaging the base chip with the bonded stack chips to form an IC package. Thus, each IC package comprises at least a base chip and a stack chip. The IC package has a size almost identical to the base chip and a thickness a little larger than the combined thickness of the base chip and the stack chip. If a known good die inspection of the base chips and stack chips are carried out prior to wafer level packaging, overall yield of the IC package is increased.
Claims
exact text as granted — not AI-modified1 . A structure of a stack package, comprising:
an independent chip set, obtained by dicing an selectively adhered wafer, wherein the selectively adhered wafer comprises:
a first wafer and a second substrate bonded to the first wafer through a plurality of adhesives, wherein the first wafer has a plurality of base chips thereon, a distance between the first wafer and the second substrate is equal to a thickness of the adhesive; and
wherein each independent chip set comprises a base chip and a portion of the second substrate.
2 . The structure of claim 1 , wherein the independent chip set is obtained by cutting a second surface of the first wafer of the selectively adhered wafer, wherein a depth of cutting is greater than a thickness of the first wafer but smaller than the total thickness of the first wafer and the adhesive; and
cutting a second surface of the second substrate of the selectively adhered wafer, wherein a depth of cutting is greater than a thickness of the second substrate but smaller than the total thickness of the second substrate and the adhesive.
3 . The structure of claim 1 , further comprises a stack chip bonded to the base chip of the independent chip set.
4 . The structure of claim 1 , further comprises a plurality of stack chips bonded to the base chip of the independent chip set.
5 . The structure of claim 1 , wherein the first wafer has a thickness between about 30 μm to 250 μm.
6 . The structure of claim 1 , wherein the first wafer has a thickness between about 30 μm to 80 μm.
7 . The structure of claim 1 , wherein the second substrate comprises a plurality of chips, and a position of each of the chips is matched with the first wafer.
8 . The structure of claim 1 , wherein the second substrate comprises a glass substrate.
9 . The structure of claim 1 , wherein the second substrate comprises a silicon wafer substrate.
10 . The structure of claim 1 , wherein the second substrate comprises a plastic substrate.
11 . The structure of claim 1 , wherein the second substrate comprises an acrylic substrate.
12 . The structure of claim 1 , wherein the second substrate comprises a polymer substrate.
13 . The structure of claim 1 , wherein the second substrate is fabricated using a transparent material.
14 . The structure of claim 1 , wherein the second substrate is fabricated using a non-transparent material.Join the waitlist — get patent alerts
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