US2006258045A1PendingUtilityA1
Semiconductor device and method of fabricating the same
Est. expiryDec 10, 2023(expired)· nominal 20-yr term from priority
Inventors:Masahiko IshiguriHirohisa MatsukiHiroyuki YodaTadahiro OkamotoMasamitsu IkumoShuichi Chiba
H10W 72/01953H10W 72/01255H10W 72/252H10W 72/29H10W 72/019H10W 72/00H10W 72/90H10W 72/071
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Claims
Abstract
A semiconductor device includes a semiconductor substrate and an array of protruding electrodes arranged at a pitch X1. Each of the protruding electrodes has a height X3 and is formed on a barrier metal base of diameter X2 coupled to an electrode arranged on the semiconductor substrate so as to satisfy the relations (X½)≦X2≦(3*X¼) and (X½)≦X3≦(3*X¼).
Claims
exact text as granted — not AI-modified1 - 2 . (canceled)
3 . A method for fabricating a semiconductor device comprising the steps of:
forming a seed layer on a semiconductor substrate; forming a resist mask having an opening at a position corresponding to an electrode located on the semiconductor substrate, the seed layer being exposed in the opening; forming a barrier metal base to include the seed layer exposed in the opening; forming a protruding electrode on the barrier metal base by plating; and after the resist mask forming step, performing a pre-treatment process in which at least one of an ashing process, an acid immersion process, and a water rinsing process is carried out.
4 . The method of claim 3 , further comprising the step of:
removing the resist mask; and etching a part of the barrier metal base so as to shape the barrier metal base.
5 . The method of claim 3 , further comprising the step of:
shaping the protruding electrode by fluxless reflow using carboxylic acid.Join the waitlist — get patent alerts
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