US2006258045A1PendingUtilityA1

Semiconductor device and method of fabricating the same

Assignee: FUJITSU LTDPriority: Dec 10, 2003Filed: Apr 27, 2006Published: Nov 16, 2006
Est. expiryDec 10, 2023(expired)· nominal 20-yr term from priority
H10W 72/01953H10W 72/01255H10W 72/252H10W 72/29H10W 72/019H10W 72/00H10W 72/90H10W 72/071
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Claims

Abstract

A semiconductor device includes a semiconductor substrate and an array of protruding electrodes arranged at a pitch X1. Each of the protruding electrodes has a height X3 and is formed on a barrier metal base of diameter X2 coupled to an electrode arranged on the semiconductor substrate so as to satisfy the relations (X½)≦X2≦(3*X¼) and (X½)≦X3≦(3*X¼).

Claims

exact text as granted — not AI-modified
1 - 2 . (canceled)  
   
   
       3 . A method for fabricating a semiconductor device comprising the steps of: 
 forming a seed layer on a semiconductor substrate;    forming a resist mask having an opening at a position corresponding to an electrode located on the semiconductor substrate, the seed layer being exposed in the opening;    forming a barrier metal base to include the seed layer exposed in the opening;    forming a protruding electrode on the barrier metal base by plating; and    after the resist mask forming step, performing a pre-treatment process in which at least one of an ashing process, an acid immersion process, and a water rinsing process is carried out.    
   
   
       4 . The method of  claim 3 , further comprising the step of: 
 removing the resist mask; and    etching a part of the barrier metal base so as to shape the barrier metal base.    
   
   
       5 . The method of  claim 3 , further comprising the step of: 
 shaping the protruding electrode by fluxless reflow using carboxylic acid.

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