Illumination module for evanescent illumination and microscope

Abstract

A microscope with a light source that produces an illumination light beam for evanescently illuminating a sample comprises an adjustment mechanism with which the polarization of the illumination light beam may be changed.

1 . Microscope with a light source that produces an illumination light beam for evanescently illuminating a sample, wherein an adjustment mechanism is provided with which the polarization of the illumination light beam may be changed.  
   
   
       2 . Microscope according to  claim 1 , wherein the microscope exhibits an objective with an objective pupil, and wherein the illumination light beam for evanescently illuminating the sample exhibits a focus in the area, of the objective pupil.  
   
   
       3 . Microscope according to  claim 2 , wherein an adjustable beam deflector is provided with which the position of the focus within the objective pupil may be moved.  
   
   
       4 . Microscope according to  claim 1 , wherein the adjustment mechanism comprises a phase plate, preferably a λ/2 plate.  
   
   
       5 . Microscope according to  claim 1 , wherein the adjustment mechanism comprises a Faraday rotator and/or a Pockels cell and/or double-refractive material and/or a liquid crystal cell.  
   
   
       6 . Microscope according to  claim 1 , wherein the adjustment mechanism is the control element of a regulator.  
   
   
       7 . Microscope according to  claim 1 , wherein a control mechanism is provided for measuring and/or monitoring the polarization of the illumination light beam.  
   
   
       8 . Microscope according to  claim 7 , wherein the control mechanism comprises a beam splitter that outcouples the measuring light from the illumination light beam.  
   
   
       9 . Microscope according to  claim 7 , wherein the control mechanism comprises at least one detector that detects the light power of at least a part of the measuring light.  
   
   
       10 . Microscope according to  claim 7 , wherein the control mechanism comprises at least one polarization analyzer, which is preferably arranged in the beam path of the measuring light before the minimum of one detector.  
   
   
       11 . Microscope according to  claim 10 , wherein the polarization analyzer comprises a polarization beam splitter.  
   
   
       12 . Microscope according to  claim 11 , wherein the polarization beam splitter splits the measuring light into an s-polarized measuring beam and a p-polarized measuring beam.  
   
   
       13 . Microscope according to  claim 12 , wherein one detector receives the s-polarized measuring beam and another the p-polarized measuring beam.  
   
   
       14 . Microscope according to  claim 7 , wherein the control mechanism is the measuring element of a regulator.  
   
   
       15 . Microscope according to  claim 1 , wherein at least the light source and the adjustment mechanism are integrated into an illumination module.  
   
   
       16 . Microscope according to  claim 15 , wherein the illumination module comprises the control mechanism.  
   
   
       17 . Microscope according to  claim 15 , wherein the microscope exhibits a microscope stand, and wherein the illumination module is detachably coupled to the microscope stand.  
   
   
       18 . Microscope according to  claim 1 , wherein a camera and/or a CCD element and/or an EMCCD element is provided for imaging.  
   
   
       19 . Microscope according to one of  claims 1  to  18 , wherein a power adjustment element is provided to change the light power of the illumination light beam.  
   
   
       20 . Microscope according to  claim 1 , wherein the microscope comprises a scanning microscope, in particular a confocal scanning microscope.  
   
   
       21 . Illumination module with a light source that produces an illumination light beam for evanescently illuminating a sample, wherein an adjustment mechanism is provided with which the polarization of the illumination light beam may be changed.  
   
   
       22 . Illumination module according to  claim 21 , wherein the microscope exhibits an objective with an objective pupil, and wherein the illumination light beam for evanescently illuminating the sample exhibits a focus in the area of the objective pupil.  
   
   
       23 . Illumination module according to  claim 22 , wherein an adjustable beam deflector is provided with which the position of the focus within the objective pupil may be moved.  
   
   
       24 . Illumination module according to  claim 21 , wherein the adjustment mechanism comprises a phase plate, preferably a λ/2 plate.  
   
   
       25 . Illumination module according to  claim 21 , wherein the adjustment mechanism comprises a Faraday rotator and/or a Pockels cell and/or double-refractive material and/or a liquid crystal cell.  
   
   
       26 . Illumination module according to  claim 21 , wherein the adjustment mechanism is the control element of a regulator.  
   
   
       27 . Illumination module according to  claim 21 , wherein a control mechanism is provided for measuring and/or monitoring the polarization of the illumination light beam.  
   
   
       28 . Illumination module according to  claim 27 , wherein the control mechanism comprises a beam splitter that outcouples the measuring light from the illumination light beam.  
   
   
       29 . Illumination module according to  claim 27 , wherein the control mechanism comprises at least one detector that detects the light power of at least a part of the measuring light.  
   
   
       30 . Illumination module according to  claim 27 , wherein the control mechanism comprises at least one polarization analyzer, which is preferably arranged in the beam path of the measuring light before the minimum of one detector.  
   
   
       31 . Illumination module according to  claim 30 , wherein the polarization analyzer comprises a polarization beam splitter.  
   
   
       32 . Illumination module according to  claim 31 , wherein the polarization beam splitter splits the measuring light into an s-polarized measuring beam and a p-polarized measuring beam.  
   
   
       33 . Illumination module according to  claim 32 , wherein one detector receives the s-polarized measuring beam and another the p-polarized measuring beam.  
   
   
       34 . Illumination module according to  claim 27 , wherein the control mechanism is the measuring element of a regulator.  
   
   
       35 . Illumination module according to  claim 21 , wherein at least the light source and the adjustment mechanism are integrated into an illumination module.  
   
   
       36 . Illumination module according to  claim 35 , wherein the illumination module comprises the control mechanism.  
   
   
       37 . Illumination module according to  claim 35 , wherein the microscope exhibits a microscope stand, and wherein the illumination module is detachably coupled to the microscope stand.  
   
   
       38 . Illumination module according to  claim 21 , wherein a camera and/or a CCD element and/or an EMCCD element is provided for imaging.  
   
   
       39 . Illumination module according to  claim 21 , wherein a power adjustment element is provided to change the light power of the illumination light beam.  
   
   
       40 . Illumination module according to  claim 21 , wherein the microscope comprises a scanning microscope, in particular a confocal scanning microscope.