Method and system of characterizing a device under test

Abstract

A system for characterizing a device under test includes an input subsystem configured to inject a signal into the device under test and to measure the response of the device under test. The system also includes a routine for automatically determining the frequency domain impedance of the device under test by constructing an s-parameter matrix and calculating the real and imaginary portions of the impedance based on the s-parameter matrix, and a routine for converting the frequency domain impedance to a time domain impedance by performing an inverse Fourier transform on the complex impedance.

1 . A system for characterizing a device under test, the system comprising: 
 an input subsystem configured to inject a signal into the device under test and to measure the response of the device under test;    a routine for automatically determining the frequency domain impedance of the device under test by constructing an s-parameter matrix and calculating the real and imaginary portions of the impedance based on the s-parameter matrix;    a routine for converting the frequency domain impedance to a time domain impedance by performing an inverse Fourier transform on the complex impedance; and    a routine for calculating the voltage noise of the device under test by convolving the time domain impedance with a predetermined current.    
     
     
         2 . A system for characterizing a device under test, the system comprising: 
 an input subsystem configured to inject a signal into the device under test and to measure the response of the device under test;    a routine for automatically determining the frequency domain impedance of the device under test by constructing an s-parameter matrix and calculating the real and imaginary portions of the impedance based on the s-parameter matrix; and    a routine for converting the frequency domain impedance to a time domain impedance by performing an inverse Fourier transform on the complex impedance.