US2006225299A1PendingUtilityA1

Method of transferring a substrate

Assignee: SAMSUNG ELECTRONICS CO LTDPriority: Feb 12, 2003Filed: Jun 13, 2006Published: Oct 12, 2006
Est. expiryFeb 12, 2023(expired)· nominal 20-yr term from priority
H10P 72/3406H10P 72/0402H10P 72/50
48
PatentIndex Score
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Cited by
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Claims

Abstract

A method of controlling contamination in a substrate transfer chamber that is disposed between a load port for supporting a container to receive a plurality of substrates and a substrate process module for processing the substrates includes supplying a purge gas into the substrate transfer chamber to purge an interior of the substrate transfer chamber, circulating the purge gas supplied into the substrate transfer chamber through a gas circular pipe, removing particles and airborne molecular contaminants from the purge gas being circulated, and resupplying the circulated purge gas into the substrate transfer chamber.

Claims

exact text as granted — not AI-modified
1 - 22 . (canceled)  
   
   
       23 . A method of controlling contamination in a substrate transfer chamber that is disposed between a load port for supporting a container to receive a plurality of substrates and a substrate process module for processing the substrates, the method comprising: 
 supplying a purge gas into the substrate transfer chamber to purge an interior of the substrate transfer chamber;    circulating the purge gas supplied into the substrate transfer chamber through a gas circular pipe;    removing particles and airborne molecular contaminants from the purge gas being circulated; and    resupplying the circulated purge gas into the substrate transfer chamber.    
   
   
       24 . The method as claimed in  claim 23 , further comprising adjusting a flow rate of the purge gas being supplied into the substrate transfer chamber.  
   
   
       25 . The method as claimed in  claim 23 , wherein the purge gas comprises an inert gas.  
   
   
       26 . The method as claimed in  claim 25 , further comprising purifying the inert gas before supplying the inert gas into the substrate transfer chamber.  
   
   
       27 . The method as claimed in  claim 23 , wherein the purge gas comprises air.  
   
   
       28 . The method as claimed in  claim 27 , further comprising removing impurities from the air before supplying the air into the substrate transfer chamber.  
   
   
       29 . The method as claimed in  claim 23 , wherein the purge gas is forcibly circulated by a pump installed in the as circular pipe.  
   
   
       30 . The method as claimed in  claim 23 , further comprising controlling a flow rate of the purge gas being circulated through the gas circular pipe.  
   
   
       31 . The method as claimed in  claim 23 , further comprising exhausting a purge gas being circulated in accordance with a pressure in the gas circular pipe.  
   
   
       32 . The method as claimed in  claim 23 , wherein the airborne molecular contaminants comprise moisture and organic contaminants.  
   
   
       33 . The method as claimed in  claim 23 , wherein the container comprises a front opening unified pod (FOUP).  
   
   
       34 . The method as claimed in  claim 23 , wherein the purge gas is supplied through a distribution panel having a plurality of holes into the substrate transfer chamber.  
   
   
       35 . The method as claimed in  claim 34 , further comprising removing particles contained in the purge gas being supplied through the holes of the distribution panel.  
   
   
       36 . The method as claimed in  claim 34 , further comprising ionizing the purge gas being supplied through the holes of the distribution panel to remove static electricity from the substrates.  
   
   
       37 . The method as claimed in  claim 34 , wherein the purge gas is purifies air.  
   
   
       38 . The method as claimed in  claim 37 , further comprising: 
 removing organic contaminants contained in the purge gas being supplied into the substrate transfer chamber using a photo catalyst filter; and    applying ultraviolet rays onto the photo catalyst filter.    
   
   
       39 . The method as claimed in  claim 38 , further comprising removing ozone contained in the purge gas being supplied into the substrate transfer chamber.  
   
   
       40 . The method as claimed in  claim 23 , further comprising: 
 measuring a differential pressure between an internal pressure and an external pressure of the substrate transfer chamber;    comparing the measured differential pressure with a predetermined differential pressure; and    adjusting a flow rate of the purge gas being supplied into the substrate transfer chamber and a flow rate of the purge gas being circulated through the gas circular pipe in accordance with a comparison result.    
   
   
       41 . The method as claimed in  claim 23 , further comprising simultaneously opening a door of the container and a door of the substrate transfer chamber.

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