Test specimen and production thereof

Abstract

A test specimen is provided which has one or more chemical substances fixed to prescribed plural independent positions on a substrate, and the quantities of the chemical substances fixed at the respective prescribed positions are the total of integer multiples of existence quantity units defined for the respective chemical substances in the range from 1 amol to 1 nmol (excluding the case in which the total quantity is zero).

1 . A test specimen having one or more chemical substances fixed to prescribed plural independent positions on a substrate, wherein the quantities of the chemical substances existing in the respective prescribed positions are totals of integer multiples of existence quantity units defined for the respective chemical substances.  
     
     
         2 . The test specimen according to  claim 1 , wherein at least one kind of the fixed chemical substances is applied onto the substrate by an inkjet system.  
     
     
         3 . The test specimen according to  claim 2 , wherein all kinds of the fixed chemical substances are applied onto the substrate by an inkjet system.  
     
     
         4 . The test specimen according to  claim 2 , wherein the quantity of the chemical substance applied onto the prescribed positions by the inkjet system is controlled by a number of liquid droplets which contain the chemical substance and ejected by the inkjet system.  
     
     
         5 . The test specimen according to  claim 4 , wherein one liquid droplet has a volume of not more than 50 pL.  
     
     
         6 . The test specimen according to  claim 1 , wherein the prescribed positions are arranged in a matrix, and are different in the existing ratios of the chemical substance.  
     
     
         7 . The test specimen according to  claim 1 , wherein the chemical substance is selected from the group consisting of metals, metal compounds, semiconductor materials, organic compounds of a number-average molecular weight of not more than 10,000, biological substances, metal ions, metal complexes, halogen ions, and substances having solubility of 1 ppb or more in water or an organic solvent at an ordinary temperature and pressure.  
     
     
         8 . The test specimen according to  claim 7 , wherein the metal, the metal compound, or the semiconductor material is applied in a state of a fine particle of a diameter of not larger than 1 μm.  
     
     
         9 . The test specimen according to  claim 1 , wherein the test specimen is used as a standard sample for quantitative analysis.  
     
     
         10 . The test specimen according to  claim 9 , wherein the quantitative analysis is conducted by time-of-flight secondary ion mass spectrometry (TOF-SIMS).  
     
     
         11 . A screening method, wherein a test object is applied by inkjet system onto the chemical substance fixed to the prescribed positions on the test specimen set forth in  claim 1 , and a reaction is detected.  
     
     
         12 . The screening method according to  claim 11 , wherein the test object contains a biological substance or a medical substance.  
     
     
         13 . The screening method according to  claim 11 , wherein the reaction is detected by time-of-flight secondary ion mass spectrometry (TOF-SIMS).