Method for microscopy, and microscope

Abstract

A method for microscopy includes generating pulsed illuminating light including wavelengths in a spectral region. A detection spectral region within the spectral region is defined. Using a dynamically controllable mask, light components of the illuminating light that comprise wavelengths within the detection spectral region are influenced. A specimen is illuminated with the influenced illuminating light. Detection light proceeding from the specimen within the detection spectral region is detected.

1 . A method for microscopy comprising: 
 generating pulsed illuminating light including wavelengths in a spectral region;    defining a detection spectral region within the spectral region;    influencing, using a dynamically controllable mask, light components of the illuminating light that comprise wavelengths within the detection spectral region;    illuminating a specimen with the influenced illuminating light; and    detecting detection light proceeding from the specimen within the detection spectral region.    
   
   
       2 . The method as defined in  claim 1 , wherein the dynamically controllable mask includes at least one of a liquid crystal display and a hinged mirror array.  
   
   
       3 . The method as defined in  claim 1 , wherein the influencing includes a removal of the light components of the illuminating light that comprise wavelengths within the detection spectral region.  
   
   
       4 . The method as defined in  claim 1 , wherein the influencing includes a modification of the polarization state of the light components of the illuminating light that comprise wavelengths within the detection spectral region.  
   
   
       5 . The method as defined in  claim 4 , wherein the modification of the polarization state encompasses a rotation of a linear polarization.  
   
   
       6 . The method as defined in  claim 4 , further comprising modifying the polarization state of light components of the detection light.  
   
   
       7 . The method as defined in  claim 1 , wherein the influencing encompasses a spectral filtration.  
   
   
       8 . The method as defined in  claim 1 , wherein a pulsed laser is provided for generating the pulsed illuminating light.  
   
   
       9 . The method as defined in  claim 1  further comprising allowing, using a further spectral filter, only light of wavelengths of the detection spectral region to arrive at the detector, wherein further spectral filter is at least partially inverse with respect to the spectral filter.  
   
   
       10 . A microscope comprising: 
 a light source configured to generate pulsed illuminating light that includes light from a spectral region;    at least one detector configured to detect detection light proceeding from a specimen in a detection spectral region, the detection spectral region being within the spectral region; and    a spectral filter including a dynamically controllable mask configured to influence light components of the illuminating light that comprise wavelengths within the detection spectral region.    
   
   
       11 . The microscope as defined in  claim 10 , wherein the dynamically controllable mask includes at least one of a liquid crystal display and a hinged mirror array.  
   
   
       12 . The method as defined in  claim 10 , wherein the dynamically controllable mask is configured to remove the light components of the illuminating light that comprise wavelengths within the detection spectral region.  
   
   
       13 . The method as defined in  claim 10 , wherein the dynamically controllable mask is configured to modify the polarization state of the light components of the illuminating light that comprise wavelengths within the detection spectral region.  
   
   
       14 . The method as defined in  claim 13 , wherein the modification of the polarization state encompasses a rotation of a linear polarization.  
   
   
       15 . The method as defined in  claim 13 , further comprising a further spectral filter configured to modify the polarization state of light components of the detection light.  
   
   
       16 . The microscope as defined in  claim 10 , further comprising a further spectral filter configured to allow only light of wavelengths of the detection spectral region to arrive at the detector, wherein the further spectral filter is at least partially inverse with respect to the spectral filter.  
   
   
       17 . The microscope as defined in  claim 10 , wherein the light source includes a pulsed laser.  
   
   
       18 . A microscope comprising: 
 a light source configured to generate pulsed illuminating light that includes light from a spectral region;    at least one detector configured to detect detection light proceeding from a specimen in a detection spectral region, the detection spectral region being within the spectral region;    a spectral filter configured to remove, from the illuminating light, light components of the illuminating light that comprise wavelengths within the detection spectral region; and    a further spectral filter configured to allow only light of wavelengths of the detection spectral region to arrive at the detector, wherein the further spectral filter is at least partially inverse with respect to the spectral filter.    
   
   
       19 . The microscope as defined in  claim 18 , further comprising a third spectral filter configured to modify the polarization state of the light components of the illuminating light that comprise wavelengths within the detection spectral region.  
   
   
       20 . The method as defined in  claim 18  wherein the light source includes a pulsed laser.