US2006091484A1PendingUtilityA1
Micro electromechanical systems thermal switch
Est. expiryFeb 21, 2023(expired)· nominal 20-yr term from priority
Inventors:Joon-Won Kang
H01H 1/0036H01H 37/52H01H 61/00H01H 2037/008
42
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Claims
Abstract
A Micro Electro-Mechanical Systems (MEMS) thermal switch. The switch includes a FET having a source and drain in a substrate and a beam isolated from the substrate, wherein the beam is a monolithic beam. The beam is positioned over the source and the drain and spaced by a predefined gap. When the thermal set point is reached, the beam moves to electrically connect the source to the drain.
Claims
exact text as granted — not AI-modified1 . A thermal switch comprising:
a FET having a source and drain in a substrate; and a beam isolated from the substrate and positioned over the source and the drain and spaced by a predefined gap, wherein the beam comprises a monolithic beam.
2 . The switch of claim 1 , wherein the beam is a metal beam having a thermal set point, when the thermal set point is reached, the metal beam electrically connects the source to the drain.
3 . The switch of claim 2 , further comprising a voltage source for applying a voltage potential to the metal beam.
4 . The switch of claim 3 , wherein the voltage source is adjusted in order to attain an electrostatic force between the metal beam and the substrate, thereby adjusting one or more of a thermal set point for the switch or hysteresis of the switch.
5 . The switch of claim 1 , wherein the beam is arched concave relative the source and the drain.
6 . The switch of claim 1 , wherein the beam is arched convex relative to the source and the drain.
7 . The switch of claim 1 , wherein the beam is an h-beam.
8 . A method of fabricating a thermal switch, comprising:
providing a silicon substrate; applying a photoresist; masking the photoresist according to a source and drain mask; etching the photoresist according to the photoresist mask; implanting at least one of N-type or P-type doped material into the substrate; removing the photoresist; applying an insulating layer; masking the insulating layer according to a predefined insulating mask; etching the insulating layer according to the insulating mask; applying a sacrificial layer; masking the sacrificial layer according to a predefined sacrificial layer mask; etching the sacrificial layer based on the applied sacrificial layer mask; applying a beam material; masking the beam material according to a predefined beam mask; etching the beam material based on the beam mask; and removing the sacrificial layer.
9 . A thermal switch comprising:
a substrate having a source and a drain separated by a predefined gap; and a connection means isolated from the substrate and positioned over the source and the drain for allowing current between the source and drain at a predefined temperature.
10 . The switch of claim 9 , wherein the connection means includes a monolithic metal beam having a thermal set point, when the thermal set point is reached, the metal beam electrically connects the source to the drain.
11 . The switch of claim 10 , further comprising a voltage means for applying a voltage potential to the metal beam.
12 . The switch of claim 11 , wherein the applied voltage potential is adjusted in order to attain an electrostatic force between the metal beam and the substrate, thereby adjusting one or more of a thermal set point for the switch or hysterisis of the switch.
13 . The switch of claim 9 , wherein the beam is arched concave relative the source and the drain.
14 . The switch of claim 9 , wherein the beam is arched convex relative to the source and the drain.
15 . The switch of claim 9 , wherein the beam is an h-beam.Join the waitlist — get patent alerts
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