Multi-chip package structure

Abstract

The present invention relates to a multi-chip package structure, comprising a first substrate, a first chip, a sub-package and a first molding compound. The first chip is attached to the first substrate. The first molding compound encapsulates the first chip, the sub-package and the top surface of the first substrate. The bottom surface of the sub-package is attached to the first chip. The sub-package comprises a second substrate, a second chip and a second molding compound. The second substrate has a top surface and a bottom surface, and is electrically connected to the first chip. The second chip is attached to the top surface of the second substrate to which the second chip is electrically connected. The second molding compound encapsulates the second chip and part of the top surface of the second substrate. Whereby, the relative large area caused by the parallel arrangement of a plurality of conventional package structures can be reduced, and there is no need to redesign signal-transmitting path.

1 . A multi-chip package structure comprising: 
 a first substrate having a top surface and a bottom surface;    a first chip attached to the top surface of the first substrate;    a plurality of first wires used for electrically connecting the first substrate and the first chip;    a sub-package having a top surface and a bottom surface, wherein the bottom surface of the sub-package is attached to the first chip, the sub-package including: 
 a second substrate having a top surface and a bottom surface, the second substrate being electrically connected to the first substrate;  
 a second chip attached to the bottom surface of the second substrate and electrically connected to the second substrate; and  
 a second molding compound used for encapsulating the second chip and part of the bottom surface of the second substrate; and  
   a first molding compound used for encapsulating the first chip, the sub-package and the top surface of the first substrate.    
     
     
         2 . The package structure according to  claim 1 , wherein the second substrate further has an opening in which the second chip is disposed, the second substrate further has at least one finger pad and at least one test pad, the finger pad is used for being electrically connected to a wire, and the test pad is used for testing.  
     
     
         3 . The package structure according to  claim 2 , wherein the finger pad and the test pad are all disposed on the top surface of the second substrate.  
     
     
         4 . The package structure according to  claim 2 , wherein the finger pad is disposed on the top surface of the second substrate, and the test pad is disposed on the bottom surface of the second substrate.  
     
     
         5 . A multi-chip package structure comprising: 
 a first substrate having a top surface and a bottom surface;    a sub-package having a top surface and a bottom surface, wherein the bottom surface of the sub-package is attached to the top surface of the first substrate, the sub-package including: 
 a second substrate having a top surface and a bottom surface, the second substrate being electrically connected to the first substrate;  
 a second chip attached to the bottom surface of the second substrate and electrically connected to the second substrate; and  
 a second molding compound used for encapsulating the second chip and part of the bottom surface of the second substrate;  
   a first chip attached to the top surface of the sub-package and electrically connected to the first substrate, the first chip having a top surface;    a third chip attached to the top surface of the first chip and electrically connected to the first chip;    a first molding compound used for encapsulating the first chip, the third chip, the sub-package and the top surface of the first substrate.    
     
     
         6 . The package structure according to  claim 5 , wherein the second substrate further has an opening in which the second chip is disposed, the second substrate further has at least one finger pad and at least one test pad, the finger pad is used for being electrically connected to a wire, and the test pad is used for testing.  
     
     
         7 . The package structure according to  claim 6 , wherein the finger pad and the test pad are all disposed on the top surface of the second substrate.  
     
     
         8 . The package structure according to  claim 6 , wherein the finger pad is disposed on the top surface of the second substrate, and the test pad is disposed on the bottom surface of the second substrate.  
     
     
         9 . A multi-chip package structure comprising: 
 a third substrate having a top surface and a bottom surface;    a first subpackage having a top surface and a bottom surface, wherein the bottom surface of the first sub-package is attached to the top surface of the third substrate, the first sub-package includes: 
 a first substrate having a top surface and a bottom surface, the first substrate being electrically connected to the third substrate;  
 a first chip attached to the top surface of the first substrate and electrically connected to the first substrate; and  
 a first molding compound used for encapsulating the first chip and part of the top surface of the first substrate;  
   a second sub-package having a top surface and a bottom surface, wherein the bottom surface of the second sub-package is attached to the top surface of the first sub-package, the second sub-package including: 
 a second substrate having a top surface and a bottom surface, the second substrate being electrically connected to the third substrate;  
 a second chip attached to the top surface of the second substrate and electrically connected to the second substrate; and  
 a second molding compound used for encapsulating the second chip and part of the top surface of the second substrate; and  
   a third molding compound used for encapsulating the first sub-package, the second sub-package and the top surface of the third substrate.    
     
     
         10 . A multi-chip package structure comprising: 
 a third substrate having a top surface and a bottom surface;    a first sub-package having a top surface and a bottom surface, wherein the bottom surface of the first sub-package is attached to the top surface of the third substrate, the first sub-package including: 
 a first substrate having a top surface and a bottom surface, the first substrate being electrically connected to the third substrate;  
 a first chip attached to the top surface of the first substrate and electrically connected to the first substrate; and  
 a first molding compound used for encapsulating the first chip and part of the top surface of the first substrate;  
   a second sub-package having a top surface and a bottom surface, wherein the bottom surface of the second sub-package is attached to the top surface of the first sub-package, the second sub-package including: 
 a second substrate having a top surface and a bottom surface, the second substrate being electrically connected to the third substrate;  
 a second chip attached to the bottom surface of the second substrate and electrically connected to the second substrate; and  
 a second molding compound used for encapsulating the second chip and part of the bottom surface of the second substrate; and  
   a third molding compound used for encapsulating the first sub-package, the second sub-package and the top surface of the third substrate.    
     
     
         11 . The package structure according to  claim 10 , wherein the second substrate further has an opening in which the second chip is disposed, the second substrate further has at least one finger pad and at least one test pad, the finger pad is used for being electrically connected to a wire, and the test pad is used for testing.  
     
     
         12 . The package structure according to  claim 11 , wherein the finger pad and the test pad are all disposed on the top surface of the second substrate.  
     
     
         13 . The package structure according to  claim 11 , wherein the finger pad is disposed on the top surface of the second substrate, and the test pad is disposed on the bottom surface of the second substrate.