US2006051601A1PendingUtilityA1

Ceramic film and method of manufacturing the same, ferroelectric capacitor, semiconductor device, and other element

Assignee: SEIKO EPSON CORPPriority: Jun 13, 2001Filed: Aug 31, 2005Published: Mar 9, 2006
Est. expiryJun 13, 2021(expired)· nominal 20-yr term from priority
H10P 14/69398H10P 14/6342C04B 2235/3205C04B 35/491C04B 35/16C04B 2235/3232C04B 2235/3227C04B 2235/3208C04B 2235/3445C04B 35/465C04B 35/4521C04B 2235/3256C23C 16/409C04B 35/624C04B 35/497C04B 2235/3244C04B 35/472C04B 2235/80C04B 35/457C04B 35/6264C04B 35/493C23C 14/08C04B 35/64C04B 2235/664C04B 2235/3436C04B 2235/3418C04B 2235/76C04B 2235/3251C04B 2235/3224C04B 2235/3298C04B 35/01C04B 35/495C04B 35/62645C23C 18/1208C04B 2235/3258C04B 35/475C04B 2235/3296C04B 2235/3427C04B 2235/3287C04B 2235/3463C04B 2235/3215C23C 16/40C04B 35/42C04B 2235/3213C04B 2235/3454C23C 18/1225H10D 84/80H10B 53/00H10N 30/078H10N 30/8561H10B 53/30
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Claims

Abstract

A method of manufacturing a ceramic film includes forming the ceramic film by crystallizing a ceramic raw material liquid which includes a first raw material liquid and a second raw material liquid. The first raw material liquid and the second raw material liquid are different types of liquids, the first raw material liquid is a raw material liquid for producing a ferroelectric, the second raw material liquid is a raw material liquid for producing an oxide such as an ABO-type oxide, a solvent included in the first raw material liquid and a solvent included in the second raw material liquid have different polarities, and the ceramic film is formed in a state in which the first raw material liquid and the second raw material liquid are phase separated so that first crystals formed of the first raw material liquid are intermittently formed in a surface direction of the ceramic film and second crystals formed of the second raw material liquid are formed so as to interpose between the first crystals.

Claims

exact text as granted — not AI-modified
1 - 37 . (canceled)  
   
   
       38 . A ferroelectric ceramic film, comprising: 
 a stack in which a first crystal layer and a second crystal layer are sequentially layered,    the second crystal layer having a melting point lower than a melting point of the first crystal layer, the first crystal layer having a PZT-based perovskite structure, and the second crystal layer having ABO-type oxides in which Pb is provided in an A-site.    
   
   
       39 . A ferroelectric ceramic film, comprising: 
 a crystal stack in which a first crystal layer, a second crystal layer, and a third crystal layer are sequentially layered,    the second crystal layer having a melting point lower than melting points of the first crystal layer and the third crystal layer, the first crystal layer having a PZT-based perovskite structure, and the second crystal layer having ABO-type oxides in which Pb is provided in an A-site.    
   
   
       40 . A ferroelectric ceramic film, comprising: 
 a stack in which a first crystal layer and a second crystal layer are sequentially layered,    the second crystal layer having a melting point higher than a melting point of the first crystal layer, the first crystal layer having a PZT-based perovskite structure, and the second crystal layer having ABO-type oxides in which Pb is provided in an A-site.    
   
   
       41 . A ferroelectric ceramic film, comprising: 
 a stack in which a first crystal layer and a second crystal layer are sequentially layered,    the second crystal layer having a melting point lower than a melting point of the first crystal layer, the first crystal layer having a PZT-based perovskite structure, and the second crystal layer having ABO-type oxides in which Si is provided in a B-site.    
   
   
       42 . A ferroelectric ceramic film, comprising: 
 a crystal stack in which a first crystal layer, a second crystal layer, and a third crystal layer are sequentially layered,    the second crystal layer having a melting point lower than melting points of the first crystal layer and the third crystal layer, the first crystal layer having a PZT-based perovskite structure, and the second crystal layer having ABO-type oxides in which Si or Ge is provided in a B-site.    
   
   
       43 . A ferroelectric ceramic film, comprising: 
 a stack in which a first crystal layer and a second crystal layer are sequentially layered,    the second crystal layer having a melting point higher than a melting point of the first crystal layer, the first crystal layer having a PZT-based perovskite structure, and the second crystal layer having ABO-type oxides in which Si or Ge is provided in a B-site.    
   
   
       44 . The ferroelectric ceramic film as defined in  claim 38 , 
 a constituent metal element of the first crystal layer and a constituent metal element of the second crystal layer being mixed in an interface region between the first crystal layer and the second crystal layer.    
   
   
       45 . The ferroelectric ceramic film as defined in  claim 38 , 
 the first crystal layer being formed on a base with a third crystal layer interposed therebetween, and    the third crystal layer having a melting point lower than a melting point of the first crystal layer.

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