US2006046627A1PendingUtilityA1

Method of improving planarization of urethane polishing pads, and urethane polishing pad produced by the same

Assignee: RENTELN PETERPriority: Aug 25, 2004Filed: Aug 25, 2004Published: Mar 2, 2006
Est. expiryAug 25, 2024(expired)· nominal 20-yr term from priority
B24B 37/24B24D 3/34
37
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Claims

Abstract

For improving planarization of urethane polishing pads, at least one layer of the pad has a base resin and an isocyanate with a concentration within a range of 6.5-11.0 weight percent to obtain a high planarization property.

Claims

exact text as granted — not AI-modified
1 . A method of improving planarization of urethane polishing pads, comprising the steps of producing at least one of urethane with a base resin; introducing in the base resin isocyanate; and selecting a concentration of the isocyanate within a range of 6.5-11.0% to obtain a high planarization property.  
     
     
         2 . A method as defined in  claim 1 , wherein selecting includes selecting a concentration of the isocyanate within a range 6.5-8.5%.  
     
     
         3 . A method as defined in  claim 1 , wherein said selecting includes selecting a concentration of the isocyanate within a range of 8.5-11.0%.  
     
     
         4 . A method as defined in  claim 1 , wherein said layer is composed of a polyurethane selected from the group consisting of a polyether polyurethane and polyester polyurethane.  
     
     
         5 . A method as defined in  claim 1 , and further comprising introducing in the layer abrasive particles selected from the group consisting of silica, alumina, ceria, titania, diamond and silicon carbide.  
     
     
         6 . A method as defined in  claim 1 , wherein said producing includes producing the at least one layer without abrasive particles.  
     
     
         7 . A method as defined in  claim 1;  and further comprising introducing a filler into the at least one layer.  
     
     
         8 . A urethane polishing pad, comprising at least one layer having a base resin, and isocyanate introduced in the base resin, wherein a concentration of the isocyanate is within a range of 6.5-11.0%.  
     
     
         9 . A urethane polishing pad as defined in  claim 8 , wherein the concentration of the isocyanate is within a range of 6.5-8.5%.  
     
     
         10 . A urethane polishing pad as defined in  claim 8 , wherein the concentration of the isocyanate is within a range of 8.5-11.0%.  
     
     
         11 . A urethane polishing pad as defined in  claim 8 , wherein at least one layer is composed of polyurethane selected from the group consisting of a polyether polyurethane and polyester polyurethane.  
     
     
         12 . A urethane polishing pad as defined in  claim 8 , wherein said at least one layer contains abrasive particles selected from the group consisting of silica, alumina, ceria, titania, diamond, and silicon carbide.  
     
     
         13 . A urethane polishing pad as defined in  claim 8 , wherein at least one layer is absent of abrasive particles.  
     
     
         14 . A urethane polishing pad as defined in  claim 8 , wherein said at least one layer includes a filler.

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