Activated species generator for rapid cycle deposition processes
Abstract
A method for providing activated species for a cyclical deposition process is provided herein. In one aspect, the method includes delivering a gas to be activated into a plasma generator, activating the gas to create a volume of reactive species, delivering a fraction of the reactive species into a processing region to react within a substrate therein, and maintaining at least a portion of the gas remaining in the plasma generator in an activated state after delivering the fraction of the gas into the process region. The plasma generator may include a high density plasma (HDP) generator, a microwave generator, a radio-frequency (RF) generator, an inductive-coupled plasma (ICP) generator, a capacitively coupled generator, or combinations thereof.
Claims
exact text as granted — not AI-modified1 . A method for forming a material with activated species during a cyclical deposition process, comprising:
activating a precursor gas to create reactive species within a plasma generator; exposing a substrate to a metal precursor within a process region during a first time period; exposing the substrate to a fraction of the reactive species to form a metal-containing compound during a second time period; and maintaining at least a portion of the reactive species within the plasma generator in an activated state during the first and second time periods.
2 . The method of claim 1 , wherein the metal precursor comprises a metal selected from the group consisting of tungsten, tantalum and titanium.
3 . The method of claim 2 , wherein the metal precursor comprises a tantalum precursor selected from the group consisting of Ta(NMe 2 ) 5 (PDMAT), Ta(NEt 2 ) 5 (PDEAT), Ta(NEtMe) 5 (PEMAT), (Et 2 N) 3 Ta(NBu) (TBTDET), (MeEtN) 3 Ta(NBu) (TBTMET), (Me 2 N) 3 Ta(NBu) (TBTDMT), derivatives thereof and combinations thereof.
4 . The method of claim 2 , wherein the metal-containing compound comprises a material selected from the group consisting of tungsten, tantalum, titanium, tungsten nitride, tantalum nitride, titanium nitride, titanium silicon nitride, tantalum silicon nitride, alloys thereof, derivatives thereof and combinations thereof.
5 . The method of claim 1 , wherein first time period lasts for about 1 second or less and the second time period lasts for about 1 second or less.
6 . The method of claim 5 , wherein first time period lasts for about 0.5 seconds or less and the second time period lasts for about 0.5 seconds or less.
7 . The method of claim 6 , wherein first time period lasts for about 0.1 seconds or less and the second time period lasts for about 0.1 seconds or less.
8 . The method of claim 5 , wherein the plasma generator comprises a high density plasma generator, a microwave generator, radio-frequency generator, an inductive-coupled plasma generator, a capacitively coupled generator, derivatives thereof and combinations thereof.
9 . A method for forming a material with activated species during a cyclical deposition process, comprising:
activating a first precursor gas to create a volume of reactive species within a plasma generator; exposing a substrate to a second precursor gas within a process region during a first time period; and exposing the substrate to a fraction of the reactive species to form a product compound during a second time period.
10 . The method of claim 9 , wherein at least a portion of the reactive species is maintained within the plasma generator in an activated state during the first and second time periods.
11 . The method of claim 9 , wherein the second precursor gas comprises a metal.
12 . The method of claim 11 , wherein the metal is selected from the group consisting of tungsten, tantalum and titanium.
13 . The method of claim 12 , wherein the product compound comprises a material selected from the group consisting of tungsten, tantalum, titanium, tungsten nitride, tantalum nitride, titanium nitride, titanium silicon nitride, tantalum silicon nitride, alloys thereof, derivatives thereof and combinations thereof.
14 . The method of claim 9 , wherein first time period lasts for about 1 second or less and the second time period lasts for about 1 second or less.
15 . The method of claim 14 , wherein first time period lasts for about 0.5 seconds or less and the second time period lasts for about 0.5 seconds or less.
16 . The method of claim 15 , wherein first time period lasts for about 0.1 seconds or less and the second time period lasts for about 0.1 seconds or less.
17 . The method of claim 14 , wherein the plasma generator comprises a high density plasma generator, a microwave generator, radio-frequency generator, an inductive-coupled plasma generator, a capacitively coupled generator, derivatives thereof and combinations thereof.
18 . A method for forming a material with activated species during a cyclical deposition process, comprising:
activating a precursor gas to create reactive species within a plasma generator; exposing a substrate to a tantalum precursor within a process region during a first time period; and exposing the substrate to a fraction of the reactive species to form a tantalum-containing layer during a second time period.
19 . The method of claim 18 , wherein the tantalum precursor comprises a compound selected from the group consisting of Ta(NMe 2 ) 5 (PDMAT), Ta(NEt 2 ) 5 (PDEAT), Ta(NEtMe) 5 (PEMAT), (Et 2 N) 3 Ta(NBu) (TBTDET), (MeEtN) 3 Ta(NBu) (TBTMET), (Me 2 N) 3 Ta(NBu) (TBTDMT), derivatives thereof and combinations thereof.
20 . The method of claim 18 , wherein the precursor gas comprises a nitrogen-containing compound.
21 . A method for forming a material with activated species during a cyclical deposition process, comprising:
positioning a substrate within a process region; activating a precursor gas to create a volume of ionic species within a plasma generator; exposing the substrate to a precursor compound to form a precursor layer thereon; purging the process region with a purge gas; flowing a fraction of the ionic species from the plasma generator to the process region; exposing the precursor layer to the fraction of the ionic species to form a product compound thereon; and purging the process region with the purge gas.
22 . The method of claim 21 , wherein at least a portion of the ionic species is maintained within the plasma generator in an activated state during the exposing and purging steps.
23 . A method for forming a material with activated species during a cyclical deposition process, comprising:
positioning a substrate within a process region; activating a precursor gas to create a volume of ionic species within a plasma generator; flowing a fraction of the ionic species from the plasma generator to the process region; and forming a product compound by repeating a deposition cycle comprising exposing the substrate sequentially to a precursor compound, a purge gas, the fraction of the ionic species and the purge gas.
24 . The method of claim 23 , wherein at least a portion of the ionic species is maintained within the plasma generator in an activated state during the deposition cycle.
25 . An apparatus for generating and delivering activated species during a cyclical deposition process, comprising:
a process chamber containing a process region between a substrate support pedestal and a lid assembly; a plasma generator positioned to fluidly communicate with the process region, wherein the plasma generator comprises a high density plasma generator, a microwave generator, radio-frequency generator, an inductive-coupled plasma generator, a capacitively coupled generator, derivatives thereof and combinations thereof; a volume of ionic species within the plasma generator; and a fraction of the ionic species within the process region.
26 . The apparatus of claim 25 , further comprising a gas manifold attached to the lid assembly, wherein the gas manifold contains at least one valve capable of providing gas pulses of about 1 second or less.
27 . The apparatus of claim 26 , wherein the at least one valve is capable of providing gas pulses of about 0.5 seconds or less.
28 . The apparatus of claim 27 , wherein the at least one valve is capable of providing gas pulses of about 0.1 seconds or less.
29 . The apparatus of claim 26 , wherein the plasma generator is extending externally from the process chamber.
30 . The apparatus of claim 26 , wherein the plasma generator is formed integrally within the process chamber.
31 . The apparatus of claim 26 , further comprising at least one precursor source in fluid communication to the gas manifold.
32 . The apparatus of claim 31 , wherein a vaporizer is positioned between the at least one precursor source and the gas manifold.
33 . The apparatus of claim 32 , wherein the at least one precursor source contains a tantalum precursor selected from the group consisting of Ta(NMe 2 ) 5 (PDMAT), Ta(NEt 2 ) 5 (PDEAT), Ta(NEtMe) 5 (PEMAT), (Et 2 N) 3 Ta(NBu) (TBTDET), (MeEtN) 3 Ta(NBu) (TBTMET), (Me 2 N) 3 Ta(NBu) (TBTDMT), derivatives thereof and combinations thereof.
34 . The apparatus of claim 31 , wherein the process chamber comprises a ceramic liner assembly.
35 . The apparatus of claim 26 , wherein a vaporizer is positioned intermediate a first precursor source containing a tantalum precursor and a first valve and the plasma generator is intermediate a second precursor source containing ammonia and a second valve.Join the waitlist — get patent alerts
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