System for measuring an electromagnetic field, a control system using the measuring system, and an electronic circuit designed for the measuring system

Abstract

This system for measuring an electromagnetic field radiated by an electrical component of an electronic circuit, the electrical component being fixed to a dielectric substrate of the electronic circuit, is wherein a transducer ( 90 to 95 ) is etched on the substrate of the electronic circuit.

1 . A system for measuring an electromagnetic field radiated by an electrical component of an electronic circuit, the electrical component being fixed to a dielectric substrate of the electronic circuit, the system comprising: 
 a unit ( 82 ) for measuring electrical energy independent of the electronic circuit, and    a transducer ( 90  to  95 ) connected to the measuring unit and adapted to convert the electromagnetic field radiated by the electrical component into electrical energy measured by the measuring unit,    wherein the transducer is etched on the substrate of the electronic circuit.    
     
     
         2 . A system according to  claim 1 , wherein the transducer ( 90  to  95 ) includes a coil and the measuring unit is adapted to measure the current in that coil.  
     
     
         3 . A system according to  claim 2 , wherein the coil is formed of a looped track ( 100 ) etched on the substrate and whose two ends form lands for connecting the coil to the measuring unit.  
     
     
         4 . A system according to  claim 2 , wherein the coil has only one turn.  
     
     
         5 . A system according to  claim 1 , for an electronic circuit in which the electronic component whose radiated electronic field is to be measured is a track connecting in parallel first and second current switching chips, wherein the transducer ( 90  to  95 ) is etched on the substrate at a location chosen to be more exposed to the electromagnetic field generated by the current switched by the first chip than that generated by the current switched by the second chip.  
     
     
         6 . An electronic circuit comprising: 
 a dielectric substrate ( 60 ), and    an electrical component ( 26  to  29 ) fixed to the substrate and whose electromagnetic radiation is to be measured,    which circuit includes a transducer ( 90  to  95 ) of a measuring system according to  claim 1  etched on the substrate to measure the electromagnetic field radiated by the electrical component.    
     
     
         7 . A circuit according to  claim 6 , wherein the electrical component is a track ( 64 ) etched on one face of the substrate and the transducer of the measuring system is etched alongside this track on the same face of the substrate.  
     
     
         8 . A circuit according to  claim 6 , wherein the electrical component is a track ( 64 ) etched on one face of the substrate and the transducer of the measuring system is etched on an opposite face of the substrate.  
     
     
         9 . A circuit according to  claim 7 , wherein the electronic circuit is a power switch module including a first switching chip and a second switching chip ( 26  to  29 ) connected in parallel by the track whose electromagnetic radiation is to be measured.  
     
     
         10 . A circuit according to  claim 9 , including a first transducer ( 90  to  95 ) etched on the substrate at a location chosen to be more exposed to the electromagnetic field generated by the current switched by the first chip than to that generated by the current switched by the second chip.  
     
     
         11 . A power switching system including: 
 a power switch module ( 20 ) including a first switching chip, a second switching chip ( 28 ,  29 ) and a dielectric substrate ( 60 ) on which a track ( 64 ) connecting the first and second switching chips in parallel is etched, and    a control unit ( 4 ) for controlling the operation of the power switch module,    which system:    includes a measuring system ( 6 ) according to  claim 5  equipped with a transducer ( 90 ) etched on the substrate of the power switch module at a location more exposed to the magnetic field generated by the current switched by the first chip ( 28 ) than to that generated by the current switched by the second chip ( 29 ), and    the control unit is adapted to control the operation of one or more of the chips as a function of the measurements carried out by the measuring system.