US2005282218A1PendingUtilityA1
Microparticle-based methods and systems and applications thereof
Individually held — no corporate assignee on recordPriority: Nov 6, 2002Filed: Jul 25, 2005Published: Dec 22, 2005
Est. expiryNov 6, 2022(expired)· nominal 20-yr term from priority
Inventors:James M. ProberXiumin CuiRudy J. DamEdwin R. HendricksonXueping JiangMichael PerryLarry E. Steenhoek
B82Y 5/00G01N 33/54373B82Y 20/00B82Y 10/00G01N 33/54346B82Y 15/00
48
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Claims
Abstract
Microparticle-based analytical methods, systems and applications are provided. Specifically, the use of resonant resonant light scattering as an analytical method for determining either or both a particle's identity and the presence and optionally, the concentration of one or more particular target analytes is described. Applications of these microparticle-based methods in biological and chemical assays are also disclosed.
Claims
exact text as granted — not AI-modified1 - 59 . (canceled)
60 . A microparticle based measuring system comprising:
(a) at least one substantially spherical identifiable particle in solution, each particle comprising; (a) a capture probe affixed to the outer surface of the particle; wherein: 1) the particle is characterized by a unique resonant light scattering signature when scanned over an analytical wavelength range having a window spanning about 1 to about 20 nanometers, over a range of optical wavelengths from about 275 to about 1900 nanometers; 2) the particle is about 75 micrometers in diameter or less; and 3) the particle has a refractive index between about 1.45 and about 2.1 over the analytical wavelength range. (b) a light scanning source for scanning the particle over the analytical wavelength range; (c) an optical cell for presenting the particle in a suitable position and in a suitable environment for detecting scattered light; (d) a particle handling means for placing particles into the optical cell; and (e) a detection means for detecting light from the scanned particle and converting said light to an electrical signal.
61 . A system of claim 60 optionally comprising a means for contacting the particles with reagents and analytes.
62 . A system of claim 60 optionally comprising a computer operably linked to the light scanning source and the detection means for the acquisition and analysis of said electrical signal generated by said detection means.
63 . A system of claim 60 optionally comprising a data analysis means for converting said electrical signal to the identity of the particle and optionally the presence or degree of binding of an analyte or group of analytes to the particle.
64 . A system of claim 60 optionally having a data analysis means for detecting binding of or identifying said analyte or group of analytes.
65 . A system of claim 60 wherein the scanned light is generated by a source selected from the group consisting of a scanning diode laser, a tunable diode laser, and a polychromatic light source.
66 . A system of claim 65 wherein the scanned light source is used with a wavelength-selecting device.
67 . A system of claim 60 wherein the scanned light source is modified with a fiber optic light coupling means.
68 . A system of claim 66 wherein said wavelength-selecting device optionally comprises components selected from the group consisting of; a dispersive element, a non-dispersive element, a monochromator, a tunable filter, a prism, a grating, and a fixed filter.
69 . A system of claim 60 wherein the scattered light from one or more particles is detected with an imaging means.
70 . A microparticle based measuring system comprising according to claim 66 wherein the imaging means comprises:
(a) a scanning diode laser light source; (b) an optical cell suitable for spectroscopic scattered light imaging and stray light rejection; (c) a means for contacting microparticles with analytes and reagents; (d) a microscope; (e) a digital camera and monitor; (f) digital image acquisition hardware; (g) a computer operably linked to the elements of (a)-(f) as needed and (h) software suitable for controlling the elements of (a)-(f), capturing data, and processing the data.Join the waitlist — get patent alerts
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