US2005263837A1PendingUtilityA1

Bump style MEMS switch

Assignee: BAR HANANPriority: Mar 31, 2003Filed: Aug 4, 2005Published: Dec 1, 2005
Est. expiryMar 31, 2023(expired)· nominal 20-yr term from priority
Inventors:Hanan Bar
H01H 2001/0084H01H 59/0009
43
PatentIndex Score
0
Cited by
0
References
0
Claims

Abstract

A microelectromechanical system switch may be formed with a protrusion defined on the substrate which makes contact with a deflectable member arranged over the substrate. The deflectable member may, for example, be a cantilevered arm or a deflectable beam. The protrusion may be formed in the substrate in one embodiment using field oxide techniques.

Claims

exact text as granted — not AI-modified
1 - 9 . (canceled)  
   
   
       10 . A microelectromechanical system comprising: 
 a substrate;    a deflectable member formed on said substrate so as to move towards and away from said substrate; and    a contact formed on said substrate protruding toward said deflectable member a portion of said contact being formed of an insulator.    
   
   
       11 . The switch of  claim 10 , said contact including a protrusion including an said insulator covered by a conductive layer.  
   
   
       12 . The switch of  claim 11  wherein said insulator is field oxide.  
   
   
       13 . The switch of  claim 10  wherein said deflectable member is a cantilevered beam.  
   
   
       14 . The switch of  claim 10  wherein said deflectable member has a lower surface which is substantially planar and substantially free of downwardly directed protrusions.  
   
   
       15 - 20 . (canceled)  
   
   
       21 . The switch of  claim 11  wherein said oxide extends into said substrate.  
   
   
       22 . The switch of  claim 13  wherein said member has a free end and a fixed end, said fixed end arranged to contact said contact on said substrate.

Join the waitlist — get patent alerts

Track US2005263837A1 — get alerts on status changes and closely related new filings.

We store only your email — no account needed. See our privacy policy.