Method and a device for bending compensation in intensity-based fibre-optical measuring systems
Abstract
Compensation is provided for bending of an optical fiber in intensity-based optical measuring systems. A measuring signal and a reference signal of different wavelengths are generated and transmitted through an optical connection towards a sensor element. The reference signal is not influenced in the sensor element. The measuring and reference signals are detected and compensation is carried out for bending of the optical connection using correction data. The correction data is based upon pre-store data concerning the relationship between the measured reference signal and the measured measuring signal as a function of the bending influence on the optical connection. Devices and methods according to the invention allow for measurements with an optical pressure measuring system that exhibit effective compensation for any bending of the optical connection.
Claims
exact text as granted — not AI-modified1 - 8 . (canceled)
9 . A measuring system for measuring a physical parameter influencing a sensor element adapted to be connected to a measuring and control unit wherein by comprising a separate information-carrying unit comprising a memory and being adapted for connection to said measuring and control unit, said information-carrying unit being coordinated with the sensor element by containing stored information regarding the properties of the measuring system and the sensor element during measurements.
10 . The measuring system according to claim 9 , wherein said sensor element is connected to said measuring and control unit via an optical connection, wherein by said stored information including pre-defined correction data concerning the relationship between the measured reference signal and the measured signal as a function of the bending influence upon said optical connection.
11 . The measuring system according to claim 9 , wherein by said reference signal and said measuring signal are of the same wavelength.
12 . The measuring system according to claim 10 , wherein by said reference signal and said measuring signal are of the same wavelength.Join the waitlist — get patent alerts
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