Multi-aperture interferometric optical system

Abstract

A multi-aperture interferometric optical system collects light propagating from a source of light and develops overlapping diffraction patterns on an optical detector that produces output signals for processing to form an image corresponding to the diffraction patterns. A preferred embodiment of the invention is a large aperture orbiting, earth-watching ring interferometric optical system configured such that there is no macro-structure pointing. Four mirror-ring structures direct incoming light to a multi-spectral primary optical detector that acquires light-pattern information from which an image can be derived.

1 . A multi-aperture interferometric optical system formed of multiple sets of mirrors mounted on support structures operatively coupled to a platform, the optical system defining a system optical axis and the multiple sets of mirrors cooperating to point the system optical axis without moving the platform on which the optical system is supported, comprising: 
 a set of spaced-apart mirrors arranged in fixed positions along the periphery of a ring structure, the mirrors configured to receive incident electromagnetic radiation propagating from a target; and    tip/tilt positioning mechanisms operatively associated with multiple ones of the mirrors to steer the electromagnetic radiation for incidence on a detector, the tip/tilt positioning mechanisms moving their associated mirrors in response to a change in the angle between the system optical axis relative to the support structure to provide a combined coherent radiation pattern at the detector.    
   
   
       2 . The optical system of  claim 1 , in which the multiple sets of mirrors point the system optical axis at an angle relative to nadir, and in which the angle relative to nadir ranges from zero degrees to about 10 degrees.  
   
   
       3 . The optical system of  claim 1 , in which the detector includes multiple detector elements each viewing a radiation pattern bandpass of predetermined wavelength range.  
   
   
       4 . The optical system of  claim 3 , in which the radiation pattern bandpasses range from visible light to the near-infrared light.  
   
   
       5 . The optical system of  claim 1 , in which each of the tip/tilt positioning mechanisms comprises an extensible piston mechanism.  
   
   
       6 . The optical system of  claim 1 , in which the detector comprises a charge-coupled device of a channel amplification type.  
   
   
       7 . The optical system of  claim 6 , in which the detector includes multiple detector elements, each viewing a radiation pattern bandpass of predetermined wavelength range.