US2005236104A1PendingUtilityA1
Method for mounting semiconductor device, as well as circuit board, electrooptic device, and electronic device
Est. expiryApr 27, 2024(expired)· nominal 20-yr term from priority
Inventors:Shuichi Tanaka
H10W 74/00H10W 72/07251H10W 72/07236H10W 72/01255H10W 72/01251H10W 72/01231H10W 72/255H10W 72/253H10W 72/252H10W 72/251H10W 72/073H10W 72/29H10W 70/05H10W 72/20H10W 72/012H10W 72/00H10W 70/60H10W 72/952H10W 72/923H10W 72/245H10W 72/221H10W 72/072H10W 72/071Y10T156/10
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Claims
Abstract
A method of forming a bonded structure comprises the steps of: mounting a semiconductor device having an electrode; a convexity protruding higher than the electrode and formed of a resin; and a conductive unit electrically coupled to the electrode and extending over the surface of the convexity, onto a specific substrate with an intermediary of a bonding material; and mounting the semiconductor device by hot pressing within a temperature range including the glass transition temperature of the resin.
Claims
exact text as granted — not AI-modified1 . A method of forming a bonded structure, comprising the steps of:
providing a semiconductor device onto a substrate with an intermediary of a bonding material, the semiconductor device having:
an electrode;
a convexity protruding higher than the electrode and formed of a resin; and
a conductive unit electrically coupled to the electrode and extending over a surface of the convexity; and
forming the bonded structure by hot pressing within a temperature range including a glass transition temperature of the resin.
2 . The method of forming a bonded structure according to claim 1 , wherein the temperature of forming the bonded structure is at least equal to a temperature at which an elastic modulus of the resin decreases.
3 . The method of forming a bonded structure according to claim 1 , wherein the resin to be used further comprises polyimide and the temperature of forming the bonded structure is between 200 degrees Celsius and 260 degrees Celsius inclusive.
4 . The method of forming a bonded structure according to claim 1 , wherein the resin further comprises one of acrylic resin and phenolic resin.
5 . The method of forming a bonded structure according to claim 1 , further comprising the steps of:
providing a plurality of the electrodes; forming a series of the convexities on the plurality of electrodes, the convexities being adjacent to each other; forming the conductive unit on a surface of the convexities corresponding to each of the electrodes; and electrically coupling the conductive unit and the electrode.
6 . The method of forming a bonded structure according to claim 1 , wherein the step of forming the conductive unit further comprises the steps of:
forming a conductive layer by sputtering; and forming a first conductive layer by patterning the conductive layer, the first conductive layer being coupled to the electrode and extending over a surface of the convexity.
7 . The method of forming a bonded structure according to claim 6 , wherein the step of forming the conductive unit further comprises the steps of:
forming a second conductive layer on the conductive layer by plating; and forming a first conductive layer by removing part of the conductive layer that is not covered with the second conductive layer.
8 . The method of forming a bonded structure according to claim 1 , wherein the bonding material further comprises a non-conductive bonding material.
9 . A circuit board comprising a semiconductor device manufactured by the method of forming a bonded structure according to claim 1 .
10 . An electro-optic device comprising the circuit board according to claim 9 .
11 . An electronic device comprising the electro-optic device according to claim 10.Join the waitlist — get patent alerts
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