US2005230244A1PendingUtilityA1

Sputter target material and method of producing the same

Assignee: HITACHI METALS LTDPriority: Mar 31, 2004Filed: Mar 3, 2005Published: Oct 20, 2005
Est. expiryMar 31, 2024(expired)· nominal 20-yr term from priority
C23C 14/3414B22F 2998/10C22C 30/00C22C 27/04C22C 1/045C23C 14/3407
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Claims

Abstract

A sputter target material which is of a sintered material, wherein the sputter target material consists of 0.5 to 50 atomic % in total of at least one metal element (M) selected from the group of Ti, Zr, V, Nb and Cr, and the balance of Mo and unavoidable impurities, and has a microstructure seen at a perpendicular cross section to a sputtering surface, in which microstructure oxide particles exist near a boundary of each island of the metal element (M), and wherein the maximum area of the island, which is defined by connecting the oxide particles with linear lines so as to form a closed zone, is not more than 1.0 mm 2 .

Claims

exact text as granted — not AI-modified
1 . A sputter target material which is of a sintered material, wherein the sputter target material consists of 0.5 to 50 atomic % in total of at least one metal element (M) selected from the group of Ti, Zr, V, Nb and Cr, and the balance of Mo and unavoidable impurities, and has a microstructure seen at a perpendicular cross section to a sputtering surface, in which microstructure oxide particles exist near a boundary of each island of the metal element (M), and wherein the maximum area of the island, which is defined by connecting the oxide particles with linear lines so as to form a closed zone, is not more than 1.0 mm 2 .  
   
   
       2 . A sputter target material according to  claim 1 , wherein the metal element (M) is Nb.  
   
   
       3 . A sputter target material according to  claim 1 , wherein the sputter target material has a sputtering surface area of 1 m 2  or more.  
   
   
       4 . A sputter target material according to  claim 1 , wherein the sputtering surface of the sputter target material has a rectangular shape, and each side length of the rectangular shape is not less than 1 m.  
   
   
       5 . A method of producing a sputter target material, which comprises the steps of: 
 blending raw powders of Mo and at least one metal element (M) selected from the group consisting of Ti, Zr, V, Nb and Cr;    compressing the blended raw powders to form a green compact;    pulverizing the green compact to produce a secondary powder having an average particle size of not more than 5.0 mm;    filling the secondary powder into a pressurizing container; and    sintering the secondary powder as contained in the pressurizing container under pressure, whereby obtaining the sputter target material,    wherein the sputter target has a microstructure seen at a perpendicular cross section to a sputtering surface, in which microstructure oxide particles exist near a boundary of each island of the metal element (M), and wherein the maximum area of the island, which is defined by connecting the oxide particles with linear lines so as to form a closed zone, is not more than 1.0 mm 2 .    
   
   
       6 . A method according to  claim 5 , which comprises a further step of subjecting the sputter target material as sintered to plastic working.

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