US2005217574A1PendingUtilityA1

Fixture and method for uniform electroless metal deposition on integrated circuit bond pads

Assignee: AMADOR GONZALOPriority: Mar 31, 2000Filed: May 25, 2005Published: Oct 6, 2005
Est. expiryMar 31, 2020(expired)· nominal 20-yr term from priority
H10W 72/5524C23C 18/1669C23C 18/1619H10W 72/5525H10W 72/5522H10W 72/251H10W 72/59H10W 72/29H10W 72/90H10W 72/012H10P 14/46
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Claims

Abstract

A method and an apparatus for uniform electroless plating of layers onto exposed metallizations in integrated circuits such as bond pads. The apparatus provides means for holding a plurality of wafers, and rotating each wafer at constant speed and synchronous within the plurality. Immersed in a plating solution flowing in substantially laminar motion and at constant speed, the method creates periodic superposition of directions and speeds of the motion of the wafers and the motion of the plating solution. The invention creates periodically changing wafer portions where the directions and speeds are additive and where the directions and speeds are opposed and subtractive. Consequently, highly uniformly layers are electrolessly plated onto the exposed metallizations of bond pads. If the plated layers are bondable metals, the process transforms otherwise unbondable pad metallization into bondable pads.

Claims

exact text as granted — not AI-modified
1 - 5 . (canceled)  
   
   
       6 . An apparatus for controlled electroless plating uniform layers onto exposed metallizations in integrated circuits positioned on the active surface of semiconductor wafers, comprising: 
 means for holding a plurality of said wafers approximately parallel to each other at pre-determined distances;    means for rotating each wafer of said plurality;    means for electroless plating in a solution flowing substantially in laminar motion at constant speed substantially parallel to said active surface of said wafers; and    means for creating periodic relative motion in changing directions between said plating solution and said wafers, whereby uniformly plated layers are electrolessly deposited onto said exposed metallizations.    
   
   
       7 . The apparatus according to  claim 6  wherein said means for rotating wafers creates constant wafer speed and synchronous rotation between wafers.  
   
   
       8 . The apparatus according to  claim 6  wherein said holding means comprises a plurality of grooved rollers positioned parallel to each other, each of said rollers having grooves around said rollers, shaped to support said wafers, the respective grooves of each roller positioned in a plane suitable for holding one of said wafers.  
   
   
       9 . The apparatus according to  claim 8  wherein said plurality of rollers comprises three rollers.  
   
   
       10 . The apparatus according to  claim 6  wherein said rotating means comprises a central sun gear driving said grooved rollers positioned in parallel around said central gear.  
   
   
       11 . The apparatus according to  claim 6  further including a motor associated with the apparatus which rotates the apparatus in a plating solution.

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