Test data generating system and method to test high-speed actual operation

Abstract

A test data generating system and method to conduct high-speed operation (actual operation) test of an LSI using a tester. The system converts existing simulation data to high-speed operation verifying test data which is formed to obtain a predetermined output expectation value after a clock signal is stopped for a predetermined period. The test data generating system includes a selecting device to select first output expectation values from simulation data and an inserting device to insert output expectation values, which are identical to a predetermined number of the first expectation values, after the first output expectation values. The system also inserts an input pattern, which is identical to a predetermined number of the input patterns, after the input pattern corresponding to the first output expectation value. A replacing device replaces the predetermined output expectation values of the simulation data with third output expectation values, and a setting device sets the first output expectation values to second output expectation values determined from the simulation data based on the predetermined number or the third output expectation values.

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       26 . An integrated circuit testing system to test high-speed operation of an integrated circuit, which receives simulation data and condition data, comprising: 
 a simulation data generating device to generate simulation data;    a condition data generating device to generate condition data;    an expectation value setting device to set an expected output value of the integrated circuit, which takes into account an amount of delay of signal propagation through the integrated circuit, based on the simulation data and the condition data.