US2005201144A1PendingUtilityA1

Low-power high-performance storage circuitry

Assignee: UNIV CALIFORNIAPriority: Mar 27, 2002Filed: Apr 28, 2005Published: Sep 15, 2005
Est. expiryMar 27, 2022(expired)· nominal 20-yr term from priority
H03K 3/012H03K 19/0016H03K 3/3565H03K 3/356156G11C 2207/2227G11C 5/063H03K 19/0185G11C 11/412G11C 11/413
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Claims

Abstract

An integrated circuit is provided comprising a latch circuit including, a first inverter including a first high threshold voltage PMOS transistor and a first high threshold voltage NMOS transistor with a first data node comprising interconnected source/drains (S/D) of the first PMOS and NMOS transistors; a second inverter including a second high threshold voltage PMOS transistor and a second high threshold voltage NMOS transistor with a second data node comprising interconnected source/drains (S/D) of the second PMOS and NMOS transistors; wherein the gates of the first PMOS and first NMOS transistors are coupled to the second data node; wherein the gates of the second PMOS and second NMOS transistors are coupled to the first data node; a first low threshold voltage access transistor including a first S/D coupled to the first data node and to the gate of the second PMOS transistor and to the gate of the second NMOS transistor and including a second S/D coupled to a first data access node and including a gate coupled to a first access control node; and a second low threshold voltage access transistor including a first S/D coupled to the second data node and to the gate of the first PMOS transistor and to the gate of the first NMOS transistor and including a second S/D coupled to a second data access node and including a gate coupled to a second access control node.

Claims

exact text as granted — not AI-modified
1 . An integrated circuit comprising: 
 a latch circuit including,    a first inverter including a first high threshold voltage PMOS transistor and a first high threshold voltage NMOS transistor with a first data node comprising interconnected source/drains (S/D) of the first PMOS and NMOS transistors;    a second inverter including a second high threshold voltage PMOS transistor and a second high threshold voltage NMOS transistor with a second data node comprising interconnected source/drains (S/D) of the second PMOS and NMOS transistors;    wherein the gates of the first PMOS and first NMOS transistors are coupled to the second data node;    wherein the gates of the second PMOS and second NMOS transistors are coupled to the first data node;    a first low threshold voltage access transistor including a first S/D coupled to the first data node and to the gate of the second PMOS transistor and to the gate of the second NMOS transistor and including a second S/D coupled to a first data access node and including a gate coupled to a first access control node; and    a second low threshold voltage access transistor including a first S/D coupled to the second data node and to the gate of the first PMOS transistor and to the gate of the first NMOS transistor and including a second S/D coupled to a second data access node and including a gate coupled to a second access control node.    
   
   
       2 - 78 . (canceled)

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