US2005186774A1PendingUtilityA1
Method of using micro-contact imprinted features for formation of electrical interconnects for substrates
Priority: Mar 31, 2003Filed: Apr 18, 2005Published: Aug 25, 2005
Est. expiryMar 31, 2023(expired)· nominal 20-yr term from priority
Inventors:Charan Gurumurthy
H10W 70/098H10W 20/055H10W 20/042H10W 20/033H10W 20/091Y10T29/49165Y10T29/49155H05K 2203/0108Y10T29/49117H05K 3/107H05K 2203/0338H05K 2201/09036H05K 3/20Y10T29/49128
45
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Claims
Abstract
An imprinting stamp to imprint an opening in a material layer in which the imprint stamp has a coating of a seed material. The seed material is transferred onto the surface within the opening to operate as a seed for filling the opening. In one embodiment, low surface energy material is used as a passivation layer between the imprinting surface and the seed coating to reduce adhesion during micro-contact transfer of the seed into the opening. The imprinting stamp is used to form trenches and via openings for formation of electrical interconnects.
Claims
exact text as granted — not AI-modified1 - 15 . (canceled)
16 . An apparatus comprising:
an imprinting stamp to imprint an opening into a material layer; a coating on a surface of the imprinting stamp which is to be transferred by micro-contact when the opening is imprinted by the imprinting stamp.
17 . The apparatus of claim 16 further comprising a passivation layer formed between the surface of the imprinting stamp and the coating to reduce adhesion of the imprinting stamp on the coating when the coating is transferred into the opening.
18 . The apparatus of claim 17 , wherein the coating is metallic and has an approximate thickness of 20-30 nanometers.
19 . The apparatus of claim 17 , wherein the coating is a metal.
20 . The apparatus of claim 17 wherein the coating is copper.Join the waitlist — get patent alerts
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