US2005181586A1PendingUtilityA1
Vertical CVD apparatus for forming silicon-germanium film
Priority: Oct 20, 2003Filed: Oct 18, 2004Published: Aug 18, 2005
Est. expiryOct 20, 2023(expired)· nominal 20-yr term from priority
Inventors:Masaki KurokawaKatsuhiko KomoriNorifumi KimuraKazuhide HasebeTakehiko FujitaAkitake TamuraYoshikazu Furusawa
C23C 16/22C23C 16/45578C23C 16/46
49
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Claims
Abstract
A vertical CVD apparatus is arranged to process a plurality of target substrates all together to form a silicon germanium film. The apparatus includes a reaction container having a process field configured to accommodate the target substrates, and a common supply system configured to supply a mixture gas into the process field. The mixture gas includes a first process gas of a silane family and a second process gas of a germane family. The common supply system includes a plurality of supply ports disposed at different heights.
Claims
exact text as granted — not AI-modified1 . A vertical CVD apparatus for processing a plurality of target substrates all together to form a silicon germanium film, the apparatus comprising:
a reaction container having a process field configured to accommodate the target substrates; a holder configured to hold the target substrates stacked at intervals within the reaction container; a heater configured to heat the process field; an exhaust system configured to exhaust the reaction container; a common supply system including a plurality of supply ports disposed at different heights and configured to supply a mixture gas into the process field, the mixture gas comprising a first process gas of a silane family and a second process gas of a germane family; a first gas supply circuit configured to supply the first process gas into the common supply system; and a second gas supply circuit configured to supply the second process gas into the common supply system.
2 . The apparatus according to claim 1 , further comprising a dopant gas supply circuit configured to supply a dopant gas into the process field, the dopant gas being used for doping the silicon germanium film with a carrier impurity.
3 . The apparatus according to claim 1 , wherein the common supply system comprises a plurality of injectors, which extend within the reaction container and respectively have uppermost supply ports at different heights.
4 . The apparatus according to claim 1 , wherein the common supply system comprises a pipe, which vertically extends within the reaction container and has the plurality of supply ports formed thereon.
5 . The apparatus according to claim 4 , wherein the plurality of supply ports have a larger hole size at a higher position.
6 . The apparatus according to claim 1 , further comprising a control section configured to control an operation of the apparatus, wherein the control section executes
forming a silicon germanium film by CVD on the target substrates within the process field, while setting the process field at a first temperature and a first pressure, and supplying a mixture gas comprising the first and second process gases into the process field through the plurality of supply ports.
7 . The apparatus according to claim 6 , wherein the control section sets the first temperature to be within a range of from 350 to 650° C., and sets the first pressure to be within a range of from 10 to 130 Pa.
8 . A vertical CVD method for processing a plurality of target substrates all together to form a silicon germanium film, the method comprising:
placing a holder in a process field within a reaction container, the holder holding the target substrates stacked at intervals; and forming a silicon germanium film by CVD on the target substrates within the process field, while setting the process field at a first temperature and a first pressure, and supplying a mixture gas into the process field through a plurality of supply ports disposed at different heights, the mixture gas comprising a first process gas of a silane family and a second process gas of a germane family.
9 . The method according to claim 8 , wherein the first temperature is set to be within a range of from 350 to 650° C., and the first pressure is set to be within a range of from 10 to 130 Pa.Join the waitlist — get patent alerts
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