Method and apparatus for generating structural data from laser reflectance images
Abstract
An apparatus for generating structural data of a structure. The apparatus includes a scanning laser range finder that produces reflectance data of the structure. The apparatus includes a memory which stores the reflectance data. The apparatus includes means for determining desired spatial relationships of the structure from the reflectance data. A method for generating structural data of a structure. The method includes the steps of producing reflectance data of the structure with a scanning laser range finder. There is the step of storing the reflectance data in a memory. There is the step of determining desired spatial relationships of the structure from the reflectance data.
Claims
exact text as granted — not AI-modified1 . An apparatus for generating structural data of a structure comprising:
a scanning laser range finder that produces reflectance data of the structure; a memory which stores the reflectance data; and means for determining desired spatial relationships of the structure from the reflectance data.
2 . An apparatus as described in claim 1 wherein the determining means includes interface means for allowing desired spatial relationships to be chosen.
3 . An apparatus as described in claim 2 wherein the data includes a reflectance image and a point cloud of the structure that are produced simultaneously by the laser range finder.
4 . An apparatus as described in claim 4 wherein the reflectance image is provided to the interface means which allows a user to work with the reflectance image that is a 2D representation of the point cloud which is a 3D representation of the structure.
5 . An apparatus described in claim 4 wherein the data includes distance measurements and reflectance measurements of the structure that have a direct correspondence.
6 . An apparatus as described in claim 5 wherein the reflectance image is formed from reflectance measurements and range data.
7 . An apparatus as described in claim 5 wherein the determining means determines a location of a discrete point in absolute coordinates of the structure; or distances between two discrete locations of the structure; or perpendicular and straight line distances between two edges in the structure; or diameters, centerlines and orientations of pipes in the structure; or perpendicular distances between pipe centerlines of the structure; or dimensions of structural elements; or nominal or standard sizes of components of the structure; or dimensions of flanges, nozzles and other pipe connections of the structure; distances between two planes of the structure; or 2D area measurements of the structure; or 3D volume measurements of the structure; measurements of multiple reflectance images of the structure; or location and orientation of planar surfaces of the structure.
8 . A method for generating structural data of a structure comprising the steps:
producing reflectance data of the structure with a scanning laser range finder; storing the reflectance data in a memory; and determining desired spatial relationships of the structure from the reflectance data.
9 . A method as described in claim 8 wherein the determining step includes the step of choosing desired spatial relationships.
10 . A method as described in claim 9 wherein the producing step includes the step of producing a reflectance image and a point cloud of the structure simultaneously by the laser range finder.
11 . A method as described in claim 10 wherein the choosing step includes the step of providing the reflectance image to an interface means which allows a user to work with the reflectance image that is a 2D representation of the point cloud which is a 3D representation of the structure.
12 . A method as described in claim 11 wherein the data includes distance measurements and reflectance measurements of the structure that have a direct correspondence.
13 . A method as described in claim 12 wherein the producing the reflectance image step includes the step of forming the reflectance image from reflectance measurements and range data.Join the waitlist — get patent alerts
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