Apparatus for electrical contact

Abstract

A fluorescent trace material is provided within at least a portion of an electrical contact or interrupter assembly component, or a cavity defined therein. At least a portion of the fluorescent trace material is exposed or released from the electrical contact or interrupter assembly component, indicating a degree of component wear.

1 . An electrical contact, comprising: 
 a fluorescent trace material, wherein at least a portion of the fluorescent trace material is released from the electrical contact as the contact experiences wear.    
   
   
       2 . The electrical contact of  claim 1 , wherein the fluorescent trace material comprises a nanocrystal quantum dot material.  
   
   
       3 . The electrical contact of  claim 1 , wherein the nanocrystal quantum dot material comprises CdSe/ZnS.  
   
   
       4 . The electrical contact of  claim 1 , wherein the fluorescent trace material is dispersed within at least a portion of the electrical contact experiencing wear.  
   
   
       5 . The electrical contact of  claim 1 , wherein the fluorescent trace material is contained in one or more portions of the electrical contact assembly experiencing wear.  
   
   
       6 . The electrical contact of  claim 5  wherein the fluorescent trace material is contained in one or more cavities formed by or secured within the electrical contact.  
   
   
       7 . An electrical contact, comprising: 
 a cavity defined in or on the contact assembly; and    a fluorescent trace material within the cavity.    
   
   
       8 . The electrical contact of  claim 6 , wherein the cavity is configured so that the fluorescent trace material is released from the cavity into a surrounding medium when the contact assembly has eroded to a detectable erosion point.  
   
   
       9 . The electrical contact of  claim 6 , wherein the cavity is configured so that the fluorescent trace material is released from the cavity into a surrounding medium when the contact assembly has eroded sufficiently that an opening develops to the cavity.  
   
   
       10 . The electrical contact of  claim 6 , wherein the fluorescent trace material is a nanocrystal quantum dot material.  
   
   
       11 . A contact assembly, comprising: 
 a conductive base;    a contact tip connected to the base or contact fabricated entirely of tungsten-based material; and    a cavity defined in the sacrificial contact, wherein the cavity contains a fluorescent trace material.    
   
   
       12 . The contact or contact assembly of  claim 10 , wherein the cavity is configured so that the fluorescent trace material is released from the cavity into a surrounding medium when the contact or contact tip has eroded to a detectable erosion point.  
   
   
       13 . The contact or contact assembly of  claim 10 , wherein the fluorescent trace material consists of the elements chosen from the elements of periodic groups II-VI, III-V or IV-VI and are nanocrystals ranging in size from 2 to 10 nanometers.  
   
   
       14 - 32 . (canceled)