US2005158921A1PendingUtilityA1

SOI substrate

Priority: Dec 24, 2002Filed: Feb 16, 2005Published: Jul 21, 2005
Est. expiryDec 24, 2022(expired)· nominal 20-yr term from priority
H10W 10/181H10P 90/1908H10D 86/01
42
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Claims

Abstract

An SOI substrate having a partial SOI structure in which a buried insulating film having a predetermined area is formed via an active layer in a part of a silicon single crystal substrate in plan view by ion-implanting elements to the part of the substrate and then applying thereto a thermal processing, wherein a thickness of a peripheral edge portion of said buried insulating film is getting thinner toward a terminal edge of said buried insulating film.

Claims

exact text as granted — not AI-modified
1 . An SOI substrate having a partial SOI structure in which a buried insulating film having a predetermined area is formed via an active layer in one part of a silicon single crystal substrate in plan view, wherein 
 a thickness of a peripheral edge portion of said buried insulating film is getting thinner toward a terminal edge of said buried insulating film.    
   
   
       2 . An SOI substrate in accordance with  claim 1 , in which a shape of said buried insulating film is circular, elliptic or polygonal shape in plan view.  
   
   
       3 . An SOI substrate in accordance with  claim 1 , in which a width of said peripheral edge portion having reduced thickness of said buried insulating film is in a range of 10 nm to 1000 nm.  
   
   
       4 . An SOI substrate in accordance with  claim 3 , in which a shape of said buried insulating film is circular, elliptic or polygonal shape in plan view.

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