Method of nondestructive examination of chromium-containing nickel-based alloy for grain boundary corrosion and examination apparatus
Abstract
Discloses is a nondestructive inspection method of grain-boundary attack due to thermal sensitization in a chromium-containing nickel-based alloy, such as Inconel 600 alloy. The method comprises measuring a saturation magnetization M s (T i ) of a test piece at each of a plurality of measuring temperatures defined by equally dividing a given measuring temperature range in the range of a minimum to a maximum of Curie temperatures corresponding to respective chromium concentrations in a chromium impoverished region of the alloy, and then quantitatively determining an average spatial distribution of the chromium impoverished region of the test piece, or the chromium-concentration-specific volume of the chromium impoverished region adjacent to the crystal grain boundaries of the test piece, according to a given calculation formula. The present invention can solve disadvantages in a conventional method of inspecting a chromium impoverished region of a chromium-containing nickel-based alloy, such as destruction of the alloy surface caused by an etching or breaking operation, which is incongruous with the philosophy of a nondestructive inspection, and poor information about chromium impoverished region, which is obtainable only in the alloy surface.
Claims
exact text as granted — not AI-modified1 . A method for nondestructive inspection of grain-boundary attack due to thermal sensitization in a chromium-containing nickel-based alloy, comprising:
measuring a saturation magnetization M s (T i ) of a test piece at each of a plurality of measuring temperatures defined by equally dividing a given measuring temperature range in the range of a minimum to a maximum of Curie temperatures corresponding to respective chromium concentrations in a chromium impoverished region of said alloy; and calculating vk according to the following formula (1) to quantitatively determine the volume of the chromium impoverished region in a divided manner on the basis of the chromium concentrations: M s ( T i ) = ∑ k = 1 i v k M k ( T i ) V , ( 1 ) wherein: vk is the volume of the chromium impoverished region having a chromium concentration C k ; V is the volume of said test piece; k is a natural number to be determined in conjunction with dividing the range of a minimum measuring temperature T min to a maximum measuring temperature T max , into n equal parts, in conformity to measurement conditions; and M k (T i ) is a saturation magnetization at a measuring temperature T i in the chromium impoverished region having the chromium concentration C k , said saturation magnetization being obtained in advance based on the following data (a), (b) and (c): (a) the relationship between saturation magnetization and chromium concentration at an absolute temperature of 0 (zero) K in the chromium impoverished region; (b) the relationship between Curie temperature and chromium concentration in the chromium impoverished region; and (c) the relationship between saturation magnetization and measuring temperature in the chromium impoverished region.
2 . An apparatus for detecting magnetic characteristics of the test piece for use in the method as defined in claim 1 , comprising:
a cooling-medium tank for containing a cooling medium; a test-piece housing disposed at the central region of said cooling-medium tank to receive said test piece therein; an exciting device mounted on the inner wall of said test-piece housing to excite said test piece; a support member for supporting said test piece in such a manner that it is located at the center position of said exciting device; a magnetic flux detector disposed around said test piece; a cooling device for supplying a cooling medium to said cooling-medium tank to circulatingly cool said test piece while allowing cooling gas generated from said cooling medium to flow into said test-piece housing; a heating device disposed below said test piece to heat said test piece; and means for controlling the measuring temperature of said test piece through the use of said cooling medium and said heating device.Join the waitlist — get patent alerts
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