US2005155677A1PendingUtilityA1
Tantalum and other metals with (110) orientation
Priority: Jan 8, 2004Filed: Jan 6, 2005Published: Jul 21, 2005
Est. expiryJan 8, 2024(expired)· nominal 20-yr term from priority
Inventors:Charles Wickersham
C30B 11/00C23C 14/3414C30B 29/02C22C 27/02C22F 1/18
43
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Claims
Abstract
Tantalum metal, niobium metal, alloys thereof and other bcc metals and alloys thereof having a texture of primary or mixed (110) on the surface and/or throughout the thickness of the metal is described. Also described are the processes for making the tantalum metal and other bcc metal with a texture of primary or mixed (110) and the process of making a sputtering target from the tantalum metal or other bcc metal with a texture of primary or mixed (110).
Claims
exact text as granted — not AI-modified1 . A tantalum metal having a texture of primary (110) on the surface, throughout the thickness, or a combination thereof.
2 . The tantalum metal of claim 1 , wherein said metal has a) a texture in which a (100) pole figure, a (111) pole figure, or a combination thereof has a center peak intensity less than about 15 random or b) a log ratio of (110):(100), (110):(111), or (110):(100):(111) center peak intensities of greater than about −4.0, or c) both.
3 . (canceled)
4 . The tantalum metal of claim 2 , wherein said center peak intensity is from about 0 random to about 10 random.
5 . (canceled)
6 . The tantalum metal of claim 2 , wherein said log ratio is from about −1.5 to about 7.0.
7 . (canceled)
8 . The tantalum metal of claim 1 , wherein said metal is fully recrystallized.
9 - 12 . (canceled)
13 . The tantalum metal of claim 1 , having a purity of from 99.99% to about 99.999%.
14 . A metal alloy comprising the tantalum metal of claim 1 .
15 . (canceled)
16 . A sputtering target comprising the tantalum metal of claim 1 .
17 . (canceled)
18 . A capacitor comprising the tantalum metal of claim 1 .
19 . (canceled)
20 . A resistive film layer comprising the tantalum metal of claim 1 .
21 . (canceled)
22 . An article comprising at least as a component the tantalum metal of claim 1 .
23 . (canceled)
24 . The tantalum metal of claim 1 , wherein the tantalum metal has a substantially fine and uniform microstructure.
25 . (canceled)
26 . The tantalum metal of claim 1 comprising an average grain size of from about 5 to about 125 microns.
27 - 28 . (canceled)
29 . The tantalum metal of claim 28 , wherein said tantalum metal includes an average grain size of from about 25 to about 50 microns.
30 . The tantalum metal of claim 1 , wherein said tantalum metal comprises grains with an average grain size, wherein 95% of said grains are less than three times said average grain size.
31 - 32 . (canceled)
33 . A process of making a sputtering target from a tantalum metal of claim 1 , comprising casting an ingot having a diameter the same or greater than the diameter of a finished sputter target and having a thickness the same as or greater than a finished target, wherein said casted ingot has a (110) texture.
34 - 37 . (canceled)
38 . A process of making a sputtering target from tantalum metal of claim 1 , comprising forming a casted ingot having a diameter smaller than the diameter of a finished target and then rolling said casted ingot to form a casted ingot having the diameter of the finished target, wherein the true strain applied in rolling the cast ingot is less than 1.0 true strain.
39 . (canceled)
40 . The process of claim 38 , wherein the amount of true strain is 0.5 or less.
41 . The process of claim 38 , wherein the true strain is from about 0.4 to about 0.5.
42 . A method of making the sputter target of claim 16 having a (110) texture, comprising cutting a plate having a (111) primary texture wherein the plate is cut into multiple strips; rotating the cut strips 90 degrees and then joining together the cut strips to form a mosaic target.
43 - 48 . (canceled)
49 . A sputter target comprising a uniform texture of primary or mixed (110) texture on the surface or throughout, wherein said tantalum metal is substantially void of (100) and/or (111) textural bands.
50 . The sputter target of claim 49 , further comprising a backing plate.
51 . The sputter target of claim 50 , wherein an interlayer is present between said backing plate and sputter target.
52 . A process for making the tantalum metal of claim 1 , comprising heating a tantalum feedstock to a temperature above its melting point to create molten drops; and solidifying said molten drops of the tantalum in a crucible.
53 - 57 . (canceled)
58 . A bcc metal or alloy thereof having a texture of primary (110) on the surface, throughout the thickness, or a combination thereof.
59 . The bcc metal of claim 58 , wherein said metal has a) a texture in which a (100) pole figure, a (111) pole figure, or a combination thereof has a center peak intensity less than about 15 random or b) a log ratio of (110):(100), (110):(111), or (110):(100):(111) center peak intensities of greater than about −4.0, or c) both.
60 - 61 . (canceled)
62 . The bcc metal or alloy thereof of claim 58 , wherein said bcc metal is niobium.
63 . The bcc metal or alloy thereof of claim 59 , wherein said bcc metal is niobium.Join the waitlist — get patent alerts
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