Methods of preparing semiconductor workpiece process fluid
Abstract
Semiconductor processor systems, systems configured to provide a semiconductor workpiece process fluid, semiconductor workpiece processing methods, methods of preparing semiconductor workpiece process fluid, and methods of delivering semiconductor workpiece process fluid to a semiconductor processor are provided. One aspect of the invention provides a semiconductor processor system including a process chamber adapted to process at least one semiconductor workpiece using a process fluid; a connection coupled with the process chamber and configured to receive the process fluid; a sensor coupled with the connection and configured to output a signal indicative of the process fluid; and a control system coupled with the sensor and configured to control at least one operation of the semiconductor processor system responsive to the signal.
Claims
exact text as granted — not AI-modified1 - 95 . (canceled)
96 . A method of preparing semiconductor workpiece process fluid comprising:
providing plural process fluid components; mixing the process fluid components to form a semiconductor workpiece process fluid; monitoring at least one of the process fluid components and the process fluid; and controlling the mixing responsive to the monitoring.
97 . The method according to claim 96 wherein the monitoring comprises monitoring the process fluid.
98 . The method according to claim 96 wherein the monitoring comprises monitoring both process fluid components.
99 . The method according to claim 96 wherein the monitoring comprises monitoring both process fluid components and the process fluid.
100 . The method according to claim 96 wherein the monitoring comprises monitoring turbidity.
101 . The method according to claim 96 wherein the controlling comprises adjusting flow rates of the process fluid components.
102 . The method according to claim 96 further comprising storing historical data of at least one of the process fluid components and the process fluid after the monitoring.
103 - 129 . (canceled)Join the waitlist — get patent alerts
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