US2005136807A1PendingUtilityA1
Polishing composition for magnetic disk
Est. expiryAug 8, 2023(expired)· nominal 20-yr term from priority
C09K 3/1463C09G 1/02C09K 3/1409
47
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Claims
Abstract
A polishing composition for a magnetic disk, comprising alumina, water, a peroxide and an organic acid; a polishing process for a substrate to be polished, comprising the step of polishing the substrate to be polished with the polishing composition; and a process for manufacturing a substrate, comprising the step of polishing a substrate to be polished with the polishing composition. The polishing composition can be suitably used for the manufacture of a magnetic disk substrate for high-quality hard disks and the like.
Claims
exact text as granted — not AI-modified1 . A polishing process for a substrate to be polished, comprising the step of polishing the substrate to be polished with a polishing composition for a magnetic disk, comprising alumina, water, a peroxide and an organic acid.
2 . The polishing process according to claim 1 , wherein said polishing composition further comprises an inorganic acid.
3 . The polishing process according to claim 1 , wherein the substrate to be polished is a substrate produced by plating an aluminum alloy with a Ni—P alloy.
4 . The polishing process according to claim 2 , wherein the substrate to be polished is a substrate produced by plating an aluminum alloy with a Ni—P alloy.
5 . A process for manufacturing a substrate, comprising the step of polishing a substrate to be polished with a polishing composition for a magnetic disk, comprising alumina, water, a peroxide and an organic acid.
6 . The process according to claim 5 , wherein said polishing composition further comprises an inorganic acid.
7 . The process according to claim 5 , wherein the substrate to be polished is a substrate produced by plating an aluminum alloy with a Ni—P alloy.
8 . The process according to claim 6 , wherein the substrate to be polished is a substrate produced by plating an aluminum alloy with a Ni—P alloy.
9 . A method for reducing waviness of a substrate to be polished, comprising the step of applying to the substrate to be polished a polishing composition comprising alumina, water, a peroxide and an organic acid.
10 . The method according to claim 9 , wherein the organic acid is one or more members selected from the group consisting of sulfur-containing organic acids, carboxylic acids, and phosphorus-containing organic acids.
11 . The method according to claim 9 , wherein the polishing composition further comprises an inorganic acid.
12 . The method according to claim 9 , wherein the polishing composition has a pH of 0.1 or more and less than 6.
13 . The method according to claim 11 , wherein the polishing composition has a pH of 0.1 or more and less than 6.
14 . A method for reducing surface stains of a substrate to be polished, comprising the step of applying to the substrate to be polished a polishing composition comprising alumina, water, a peroxide and an organic acid.
15 . The method according to claim 14 , wherein the organic acid is one or more members selected from the group consisting of sulfur-containing organic acids, carboxylic acids, and phosphorus-containing organic acids.
16 . The method according to claim 14 , wherein the polishing composition further comprises an inorganic acid.
17 . The method according to claim 14 , wherein the polishing composition has a pH of 0.1 or more and less than 6.
18 . The method according to claim 16 , wherein the polishing composition has a pH of 0.1 or more and less than 6.Join the waitlist — get patent alerts
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