US2005093115A1PendingUtilityA1

Method of mounting a circuit component and joint structure therefor

Assignee: DELPHI TECH INCPriority: Jun 14, 2001Filed: Nov 23, 2004Published: May 5, 2005
Est. expiryJun 14, 2021(expired)· nominal 20-yr term from priority
H10W 90/764H10W 72/07336H10W 72/07327H10W 72/07141H10W 72/5525H10W 72/5475H10W 72/5449H10W 72/5363H10W 72/884H10W 72/871H10W 72/624H10W 72/354H10W 72/352H10W 72/321H10W 72/075H10W 72/073H10W 72/30H10W 40/257H10W 72/926H10W 72/331H10W 72/50H05K 3/341H05K 3/3442H05K 2201/10636H05K 2201/0281H05K 2201/10537Y02P70/50
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Claims

Abstract

A joint structure and method for bonding together two components, such as when attaching an electrical circuit element to a conductor on a substrate. The joint structure comprises a mesh infiltrated by a solder material, in which the mesh is preferably formed of a material having a higher thermal conductivity than the solder material. The joint structure is able to offer improvements in thermal conductivity, electrical conductivity, reflow processing, and stress distribution between the structures it connects. Each of these attributes of the joint structure can be tailored to some degree by the choices of materials for the mesh and the solder material.

Claims

exact text as granted — not AI-modified
1 . A semiconductor assembly comprising a heat-generating integrated circuit chip that is attached to a heatsink on a substrate with an electrically-conductive joint structure located between and contacting a surface of the integrated circuit chip and a surface of the heatsink, the joint structure comprising an electrically-conductive flexible mesh infiltrated by a solder material that bonds together the integrated circuit chip, the heat sink and the mesh, a solder-free portion of the mesh extending outside of the joint structure and from between the integrated circuit chip and the heatsink to define a flexible jumper to the integrated circuit chip, the mesh being formed of woven strands of copper or copper alloy wire, the mesh substantially establishing the thickness of the joint structure.  
     
     
         2 . (canceled)  
     
     
         3 . (canceled)  
     
     
         4 . (canceled)  
     
     
         5 . The semiconductor assembly according to  claim 4   1 , further comprising an interconnect strap contacting a second surface of the integrated circuit chip and a third component on the substrate, the interconnect strap comprising an electrically-conductive flexible mesh having first and second portions at the second surface of the integrated circuit chip and the third component, respectively, and an intermediate portion therebetween, the first and second portions of the mesh being infiltrated by a solder material that bonds the mesh to the second surface of the integrated circuit chip and to the third component while the intermediate portion is substantially free of a solder material so as to remain flexible.  
     
     
         6 . The semiconductor assembly according to  claim 5 , wherein the solder material of the interconnect strap has a lower melting temperature than the solder material of the joint structure.

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