Microscope having a reference specimen
Abstract
The present invention concerns a microscope, in particular a confocal or double confocal scanning microscope, as well as a method for operating a microscope, at least one specimen support unit associated with the specimen being provided, at least one reference specimen of known configuration being provided, and the reference specimen being detectable by light microscopy for calibration, alignment or adjustment of the microscope. With the microscope according to the present invention and the method according to the invention for operating a microscope, drift-related changes can be detected and compensated for. Auxiliary means with which a specimen can easily and reliably be focused are also provided.
Claims
exact text as granted — not AI-modified1 . A microscope comprising:
at least one transparent specimen support unit associated with a specimen, and a reference specimen including at least one planar area having a defined structure of known configuration, the reference specimen being detectable by light microscopy for at least one of calibration, alignment, and adjustment of the microscope.
2 . The microscope as defined in claim 1 wherein the microscope is a confocal scanning microscope.
3 . The microscope as defined in claim 1 wherein the microscope is a double confocal scanning microscope.
4 . The microscope as defined in claim 1 , wherein the specimen support unit includes glass.
5 . The microscope as defined in claim 1 , wherein the specimen support unit includes a specimen slide.
6 . The microscope as defined in claim 1 , wherein the reference specimen includes a cover glass affixed on the specimen support unit, the cover glass including the at least one planar area.
7 . The microscope as defined in claim 1 , wherein the planar area includes a texture or a structure.
8 . The microscope as defined in claim 7 , wherein the texture or structure is of asymmetrical configuration.
9 . The microscope as defined in claim 1 , wherein the planar area includes a coating or a holographic impression.
10 . The microscope as defined in claim 9 , wherein the coating is of reflective or luminescent configuration.
11 . A microscope comprising:
at least one transparent specimen support unit associated with a specimen, and a reference specimen including at least one microscopic object disposed on the specimen support unit, the reference specimen being detectable by light microscopy for at least one of calibration, alignment, and adjustment of the microscope.
12 . The microscope as defined in claim 11 , wherein the microscopic object includes beads or nanocrystals.
13 . The microscope as defined in claim 11 , wherein the at least one microscopic object includes a plurality of microscopic objects, the microscopic objects being stochastically distributed.
14 . A microscope comprising:
at least one transparent specimen support unit associated with a specimen, the least one transparent specimen support unit including at least one planar area configured as a reference specimen having a defined structure of known configuration, the reference specimen being detectable by light microscopy for at least one of calibration, alignment, and adjustment of the microscope.
15 . The microscope as defined in claim 14 , wherein the microscope is a confocal scanning microscope.
16 . The microscope as defined in claim 14 , wherein the microscope is a double confocal scanning microscope.
17 . The microscope as defined in claim 14 , wherein the specimen support unit includes glass.
18 . The microscope as defined in claim 14 , wherein the specimen support unit includes a specimen slide.
19 . The microscope as defined in claim 14 , wherein the planar area includes a texture or a structure.
20 . The microscope as defined in claim 14 , wherein the planar area includes a coating or a holographic impression.Join the waitlist — get patent alerts
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