US2005040522A1PendingUtilityA1

High-frequency semiconductor device

Assignee: MATSUSHITA ELECTRIC INDUSTRIAL CO LTDPriority: Oct 17, 2001Filed: Oct 7, 2004Published: Feb 24, 2005
Est. expiryOct 17, 2021(expired)· nominal 20-yr term from priority
H10W 72/5522H10W 74/00H10W 90/754H10W 90/724H10W 44/20H10W 74/114H10W 70/614H05K 3/4614H05K 3/4629H05K 3/284H05K 1/183H05K 1/0306H05K 1/186H05K 1/112
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Claims

Abstract

A high-frequency semiconductor device is provided with a ceramic substrate, an element group including semiconductor elements and passive components mounted onto a bottom portion of the ceramic substrate, and a composite resin material layer formed on the bottom portion of the ceramic substrate so as to bury the element group. The composite resin material layer is formed by a composite resin material including an epoxy resin and an inorganic filler material, and has a flat bottom surface on which electrodes for connecting to the outside are formed. As packaging of a structure in which the receiving system and the transmitting system are formed in a single unit, such as an RF module, the high-frequency semiconductor device achieves a small size, a high mounting density, and excellent heat release properties.

Claims

exact text as granted — not AI-modified
1 .- 7 . (CANCELED)  
   
   
       8 . A high-frequency semiconductor element comprising: 
 a ceramic substrate having a cavity portion in its bottom portion;    an element group including semiconductor elements and passive components mounted to the bottom portion of the cavity portion;    a composite resin material layer formed so as to bury the element group in the cavity portion; and    electrodes for connecting to the outside that are formed on a bottom portion of the ceramic substrate other than at the cavity portion;    wherein the composite resin material layer is formed by a composite resin material including an epoxy resin and an inorganic filler material, and a bottom portion of the composite resin material layer is flat in shape.

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