Wafer-level chip scale package and method for fabricating and using the same
Abstract
A packaged semiconductor device (a wafer-level chip scale package) containing a conductive adhesive material as an electrical interconnect route between the semiconductor die and a patterned conductive substrate is described. The patterned conductive substrate acts not only as a substrate, but also as a redistribution layer that converts the dense pad layout of the die to a larger array configuration of the solder balls in the circuit board. Using the invention allows the formation of a lower priced chip scale package that also overcomes the restriction of the die size used in die-sized chip packages and the input-output pattern that can be required by the printed circuit board. Thus, the invention can provide a familiar pitch (i.e.,interface) to the printed circuit board for any small die.
Claims
exact text as granted — not AI-modified1 . A wafer-level chip scale package, comprising:
a chip containing a stud bump; a conductive substrate; and an adhesive material containing conductive particles located between the chip and the substrate.
2 . The package of claim 1 , wherein a conductive particle is located between the stud bump and the substrate.
3 . The package of claim 1 , wherein the conductive particles comprise metal with an insulating layer.
4 . The package of claim 1 , wherein the adhesive material comprises an anisotropic conductive film, an anisotropic conductive paste, or an isotropic conductive paste.
5 . The package of claim 1 , wherein the chip contains an integrated circuit in communication with a chip pad.
6 . The package of claim 1 , wherein the conductive substrate has been patterned.
7 . The package of claim 6 , wherein the patterned conductive substrate serves as a redistribution layer.
8 . The package of claim 1 , wherein the conductive substrate comprises copper.
9 . The package of claim 8 , wherein the conductive substrate comprises copper foil.
10 . The package of claim 1 , wherein the stud bump comprises Cu.
11 . A wafer-level chip scale package, comprising:
a chip containing a stud bump; a conductive substrate; and an adhesive material containing conductive particles located between the chip and the substrate with at least one conductive particle located between the stud bump and the bond pad.
12 . The package of claim 11 , wherein the adhesive material comprises an anisotropic conductive film, an anisotropic conductive paste, or an isotropic conductive paste.
13 . The package of claim 11 , wherein the conductive substrate has been patterned and the patterned conductive substrate serves as a redistribution layer.
14 . The package of claim 11 , wherein the conductive substrate comprises copper foil.
15 . A packaged semiconductor device, comprising:
a chip containing a stud bump; a patterned conductive substrate; and an adhesive material containing conductive particles located between the chip and the substrate with at least one conductive particle located between the stud bump and the bond pad.
16 . The device of claim 15 , wherein the adhesive material comprises an anisotropic conductive film, an anisotropic conductive paste, or an isotropic conductive paste.
17 . The device of claim 15 , wherein the conductive substrate comprises copper foil.
18 . The package of claim 15 , wherein the patterned conductive substrate serves as a redistribution layer.
19 . An electronic apparatus containing a packaged semiconductor device, the device comprising:
a chip containing a stud bump; a conductive substrate; and an adhesive material containing conductive particles located between the chip and the substrate.
20 . A method for making wafer-level chip scale package, comprising:
providing a chip containing a stud bump; providing a conductive substrate; and attaching the chip to the substrate using an adhesive material containing conductive particles.
21 . The method of claim 20 , wherein the adhesive material comprises an anisotropic conductive film, an anisotropic conductive paste, or an isotropic conductive paste.
22 . The method of claim 20 , further comprising patterning the conductive substrate.
23 . The method of claim 22 , wherein the patterned conductive substrate serves as a redistribution layer.
24 . A method for making wafer-level chip scale package, comprising:
providing a chip with a stud bump; providing a conductive substrate; providing an adhesive material containing conductive particles on the chip, the substrate, or both; pressing the chip and the substrate together; and curing the adhesive material.
25 . The method of claim 24 , further comprising providing the chip with a chip pad.
26 . The method of claim 24 , including providing at least one conductive particle between the stud bump and the conductive substrate.
27 . The method of claim 24 , wherein the adhesive material comprises an anisotropic conductive film, an anisotropic conductive paste, or an isotropic conductive paste.
28 . The method of claim 24 , wherein the curing the adhesive material electrically and mechanically connects the chip to the substrate.
29 . The method of claim 24 , further comprising patterning the conductive substrate.
30 . The method of claim 29 , wherein the patterned conductive substrate serves as a redistribution layer.
31 . The method of claim 24 , wherein the stud bump comprises Cu.
32 . A method for making an electronic apparatus containing a wafer-level chip scale package, the method comprising:
providing a chip containing a stud bump, providing a conductive substrate, and attaching the chip to the substrate using an adhesive material containing conductive particles; and mounting the wafer-level chip scale package on a circuit board.Join the waitlist — get patent alerts
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