Technique for determining performance characteristics of electronic systems

Abstract

A technique for determining performance characteristics of electronic systems is disclosed. In one exemplary embodiment, the technique may be realized as a method for determining performance characteristics of electronic systems. The method includes the steps of measuring a first response on a transmission medium from a falling edge transmitted on the transmission medium, and measuring a second response on the transmission medium from a rising edge transmitted on the transmission medium. The method also includes the step of determining worst case bit patterns for transmission on the transmission medium based upon the first response and the second response.

1 . A method for determining performance characteristics of electronic systems, the method comprising the steps of: 
 measuring a first response on a transmission medium from a falling edge transmitted on the transmission medium;    measuring a second response on the transmission medium from a rising edge transmitted on the transmission medium; and    determining worst case bit patterns for transmission on the transmission medium based upon the first response and the second response.    
   
   
       2 . The method as defined in  claim 1 , further comprising the step of: 
 transmitting the worst case bit patterns from an electronic device onto the transmission medium for determining performance characteristics associated with the electronic device and the transmission medium.    
   
   
       3 . The method as defined in  claim 2 , wherein the performance characteristics include worst case timing margins associated with the electronic device and the transmission medium.  
   
   
       4 . The method as defined in  claim 2 , wherein the performance characteristics include worst case voltage margins associated with the electronic device and the transmission medium.  
   
   
       5 . The method as defined in  claim 2 , wherein the performance characteristics include worst case timing and voltage margins associated with the electronic device and the transmission medium.  
   
   
       6 . The method as defined in  claim 1 , wherein the step of measuring a first response on a transmission medium includes the step of: 
 sampling the voltage of the first response on the transmission medium.    
   
   
       7 . The method as defined in  claim 6 , wherein the step of sampling the voltage of the first response on the transmission medium includes periodically sampling the voltage of the first response on the transmission medium.  
   
   
       8 . The method as defined in  claim 6 , wherein the step of sampling the voltage of the first response on the transmission medium includes non-periodically sampling the voltage of the first response on the transmission medium.  
   
   
       9 . The method as defined in  claim 6 , wherein the step of measuring a first response on a transmission medium also includes the step of: 
 calculating the difference between each voltage sample and a steady state reference voltage.    
   
   
       10 . The method as defined in  claim 9 , wherein the step of measuring a first response on a transmission medium also includes the step of: 
 generating a falling edge vector based upon the differences between each voltage sample and the steady state reference voltage.    
   
   
       11 . The method as defined in  claim 1 , wherein the step of measuring a second response on the transmission medium includes the step of: 
 sampling the voltage of the second response on the transmission medium.    
   
   
       12 . The method as defined in  claim 11 , wherein the step of sampling the voltage of the second response on the transmission medium includes periodically sampling the voltage of the second response on the transmission medium.  
   
   
       13 . The method as defined in  claim 11 , wherein the step of sampling the voltage of the second response on the transmission medium includes non-periodically sampling the voltage of the second response on the transmission medium.  
   
   
       14 . The method as defined in  claim 11 , wherein the step of measuring a second response on the transmission medium also includes the step of: 
 calculating the difference between each voltage sample and a steady state reference voltage.    
   
   
       15 . The method as defined in  claim 14 , wherein the step of measuring a second response on the transmission medium also includes the step of: 
 generating a rising edge vector based upon the differences between each voltage sample and the steady state reference voltage.    
   
   
       16 . The method as defined in  claim 1 , wherein the step of determining worst case bit patterns includes determining worst case timing margin bit patterns for transmission on the transmission medium.  
   
   
       17 . The method as defined in  claim 1 , wherein the step of determining worst case bit patterns includes determining worst case voltage margin bit patterns for transmission on the transmission medium.  
   
   
       18 . The method as defined in  claim 1 , wherein the step of determining worst case bit patterns includes determining worst case timing margin bit patterns and worst case voltage margin bit patterns for transmission on the transmission medium.  
   
   
       19 . The method as defined in  claim 1 , wherein the step of determining worst case bit patterns includes the step of: 
 choosing a type of signal degradation parameter.    
   
   
       20 . The method as defined in  claim 19 , wherein the step of choosing a type of signal degradation parameter includes choosing a type of signal degradation from one of a low side signal degradation, a high side signal degradation, a signal edge pull-in, and a signal edge push-off.  
   
   
       21 . The method as defined in  claim 19 , wherein the step of determining worst case bit patterns also includes the step of: 
 choosing an ending condition.    
   
   
       22 . The method as defined in  claim 21 , wherein the step of choosing an ending condition includes choosing an ending condition from one of a low output voltage level and a high output voltage level.  
   
   
       23 . The method as defined in  claim 21 , wherein the step of determining worst case bit patterns also includes the step of: 
 analyzing one of a falling edge vector generated based upon the first response and a rising edge vector generated based upon the second response to determine whether or not a state transition will cause a desired signal degradation at the ending condition.    
   
   
       24 . The method as defined in  claim 23 , wherein the step of determining worst case bit patterns also includes the step of: 
 analyzing one of the falling edge vector and the rising edge vector to determine whether or not a state transition will cause a desired signal degradation at each previously occurring bit time.    
   
   
       25 . The method as defined in  claim 24 , wherein the step of determining worst case bit patterns also includes the step of: 
 repeating the step in  claim 24  using a desired amount of the falling edge vector and the rising edge vector.    
   
   
       26 . A computer signal embodied in a carrier wave readable by a computing system and encoding a computer program of instructions for executing a computer process performing the method recited in  claim 1 .  
   
   
       27 . A signal embodied in a carrier wave and representing sequences of instructions which, when executed by at least one processor, cause the at least one processor to determine performance characteristics of electronic systems by performing the steps of: 
 measuring a first response on a transmission medium from a falling edge transmitted on the transmission medium;    measuring a second response on the transmission medium from a rising edge transmitted on the transmission medium; and    determining worst case bit patterns for transmission on the transmission medium based upon the first response and the second response.    
   
   
       28 . An article of manufacture for determining performance characteristics of electronic systems, the article of manufacture comprising: 
 at least one processor readable carrier; and    instructions carried on the at least one carrier; wherein the instructions are configured to be readable from the at least one carrier by at least one processor and thereby cause the at least one processor to operate so as to: 
 measure a first response on a transmission medium from a falling edge transmitted on the transmission medium;  
 measure a second response on the transmission medium from a rising edge transmitted on the transmission medium; and  
 determine worst case bit patterns for transmission on the transmission medium based upon the first response and the second response.  
   
   
   
       29 . An integrated circuit device having a transmitter for transmitting signals from the integrated circuit device onto a transmission medium, the integrated circuit device comprising: 
 a falling edge generator electrically connected to the transmitter for generating a falling edge signal for transmission by the transmitter onto the transmission medium so as to provide a falling edge response associated with the transmission medium for generating an associated falling edge vector; and    a rising edge generator electrically connected to the transmitter for generating a rising edge signal for transmission by the transmitter onto the transmission medium so as to provide a rising edge response associated with the transmission medium for generating an associated rising edge vector.    
   
   
       30 . The integrated circuit device as defined in  claim 29 , wherein the falling edge generator and the rising edge generator are formed in a combined falling/rising edge generator.  
   
   
       31 . An integrated circuit device having a receiver for receiving signals from a transmission medium, the integrated circuit device comprising: 
 a sampling and differencing circuit electrically connected to the transmission medium for sampling a signal propagating along the transmission medium prior to being received by the receiver, and for calculating the difference between a sampled signal value and a reference value.