Ceramic substrate for a semiconductor producing/examining device
Abstract
It is an object of the present invention to provide a ceramic substrate for a semiconductor producing/examining device which has high fracture toughness value, excellent thermal shock resistivity, high thermal conductivity and an excellent temperature rising and falling properties, and is preferable as a hot plate, an electrostatic chuck, a wafer prober and the like. A ceramic substrate, for a semiconductor producing/examining device, having a conductor formed inside thereof or on the surface thereof of the present invention is the ceramic substrate, wherein said ceramic substrate has been sintered such that a fractured section thereof exhibits intergranular fracture.
Claims
exact text as granted — not AI-modified1 . A ceramic substrate, for a semiconductor producing/examining device, having a conductor formed inside thereof or on the surface thereof,
wherein said ceramic substrate has been sintered such that a fractured section thereof exhibits intergranular fracture.
2 . The ceramic substrate for a semiconductor producing/examining device according to claim 1 ,
wherein an average diameter of ceramic grains of said fractured section is 0.5 to 10 μm.
3 . The ceramic substrate for a semiconductor producing/examining device according to claim 1 ,
wherein an impurity element is locally distributed in boundaries of ceramic grains of said fractured section.
4 . The ceramic substrate for a semiconductor producing/examining device according to claim 1 ,
wherein thermal conductivity of said ceramic substrate is 100 W/m·K or more.
5 . The ceramic substrate for a semiconductor producing/examining device according to claim 1 ,
wherein said ceramic substrate is constituted such that: an impurity-existent area where an impurity element is locally distributed in triple points of crystal grains, and an impurity element-nonexistent area where an impurity is not locally distributed in the triple points of the crystal grains, coexist therein.Join the waitlist — get patent alerts
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