US2004194887A1PendingUtilityA1

Process for producing semiconductor device

Priority: Aug 23, 2001Filed: Apr 16, 2004Published: Oct 7, 2004
Est. expiryAug 23, 2021(expired)· nominal 20-yr term from priority
H10P 50/268Y10S438/907Y10S438/905
43
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Claims

Abstract

By conducting etching treatment using at least two steps with different compositions of gases for each step, and at least one step comprising using a gas capable of decomposing and vaporizing etching products in an etching apparatus continuously, semiconductor devices can be produced with high productivity, low contaminant and good reproducibility of treatment state.

Claims

exact text as granted — not AI-modified
What is claimed is:  
     
         1 . A plasma etching treatment apparatus comprising: 
 an etching treatment room;    a substrate stage for placing a semiconductor substrate thereon installed in the etching treatment room;    a plasma generating means for generating plasma in the etching treatment room;    a gas introducing means for introducing (a) a treating gas for etching and (b) a treating gas for decomposing and removing etching products, into the etching treatment room; and    a monitoring means for monitoring a retained amount of etching products.    
     
     
         2 . A plasma etching treatment apparatus comprising: 
 an etching treatment room;    a substrate stage, for placing a semiconductor substrate thereon, installed in the etching treatment room;    a plasma generating means for generating plasma in the etching treatment room; and    a gas introducing means for introducing a treating gas into the etching treatment room.

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