Plating method
Abstract
An object of the present invention is to provide a plating method which can form defect-free, completely-embedded interconnects of a conductive material in recesses in the surface of a substrate even when the recesses are of a high aspect ratio, and which can improve the flatness of a plated film on the substrate even when narrow trenches and broad trenches are co-present in the surface of the substrate. A plating method according to the present invention includes: providing a high resistance structure between a surface of a substrate, said surface being connected to a cathode electrode, and an anode electrode; filling the space between the substrate and the anode electrode with a plating solution while applying a voltage between the cathode electrode and the anode electrode; and growing a plated film on the surface of the substrate while controlling an electric current flowing between the cathode electrode and the anode electrode at a constant value.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A plating method, comprising:
providing a high resistance structure between a surface of a substrate, said surface being connected to a cathode electrode, and an anode electrode; filling the space between the substrate and the anode electrode with a plating solution while applying a voltage between the cathode electrode and the anode electrode; and growing a plated film on the surface of the substrate while controlling an electric current flowing between the cathode electrode and the anode electrode at a constant value.
2 . The plating method according to claim 1 , wherein the voltage is applied for 100 to 2000 msec after the electric current begins to flow between the cathode electrode and the anode electrode.
3 . The plating method according to claim 1 , wherein the voltage applied is such as to allow an electric current with an average cathodic current density, with respect to the surface of the substrate, of 1 to 30 mA/cm 2 to flow.
4 . The plating method according to claim 3 , wherein the voltage is applied for 100 to 2000 msec after the electric current begins to flow between the cathode electrode and the anode electrode.
5 . A plating method, comprising:
providing a high resistance structure between a surface of a substrate, said surface being connected to a cathode electrode, and an anode electrode; filling the space between the substrate and the anode electrode with a plating solution; and growing a plated film on the surface of the substrate while controlling an electric current flowing between the cathode electrode and the anode electrode at stepwise changing constant values.
6 . The plating method according to claim 5 , wherein the plating solution is changed for a different plating solution in the process of film formation.
7 . The plating method according to claim 6 , wherein the surface of the substrate is cleaned in the process of film formation.
8 . The plating method according to claim 5 , wherein the value of the electric current flowing between the cathode electrode and the anode electrode is increased stepwise.
9 . The plating method according to claim 8 , wherein the plating solution is changed for a different plating solution in the process of film formation.
10 . The plating method according to claim 9 , wherein the surface of the substrate is cleaned in the process of film formation.
11 . A plating method, comprising:
providing a high resistance structure between a surface of a substrate, said surface being connected to a cathode electrode, and a anode electrode; filling the space between the substrate and the anode electrode with a plating solution; growing a plated film on the surface of the substrate while controlling an electric current flowing between the cathode electrode and the anode electrode at a constant value; reversing the direction of the electric current flowing between the cathode electrode and the anode electrode to etch away the surface of the plated film; and further growing the plated film on the surface of the substrate while controlling an electric current flowing between the cathode electrode and the anode electrode at a constant value.
12 . The plating method according to claim 11 , wherein the step of etching the surface of the plated film and the subsequent step of growing the plated film are carried out repeatedly.
13 . A plating method, comprising:
filling the space between a surface of a substrate, said surface being connected to a cathode electrode, and an anode electrode with a plating solution while applying a voltage between the cathode electrode and the anode electrode; and growing a plated film on the surface of the substrate while controlling an electric current flowing between the cathode electrode and the anode electrode at a constant value.
14 . The plating method according to claim 13 , wherein the voltage is applied for 100 to 200 msec after the electric current begins to flow between the cathode electrode and the anode electrode.
15 . The plating method according to claim 13 , wherein the voltage applied is such as to allow an electric current with an average cathodic current density, with respect to the surface of the substrate, of 1 to 30 mA/cm 2 to flow.
16 . The plating method according to claim 15 , wherein the voltage is applied for 100 to 2000 msec after the electric current begins to flow between the cathode electrode and the anode electrode.Join the waitlist — get patent alerts
Track US2004149584A1 — get alerts on status changes and closely related new filings.
We store only your email — no account needed. See our privacy policy.