Apparatus and method for measuring vision defects of a human eye
Abstract
An apparatus for measuring vision characteristics of an eye includes a laser for providing an optical beam and a focusing element for focusing the optical beam behind a retina of the eye for providing a finite source of secondary radiation on the retina of the eye. The secondary radiation is emitted from the retina as a reflected wavefront of radiation that passes outward from the eye. A polarizer is placed within a path of the optical beam for transmitting a polarized wavefront therethrough. A wavefront analyzer receives the polarized wavefront for measuring distortions associated therewith.
Claims
exact text as granted — not AI-modifiedThat which I claimed I:
1 . An apparatus for measuring vision characteristics of an optical system, the apparatus comprising:
focusing means for focusing an optical beam proximate a posterior surface of the optical system for providing a finite source of secondary radiation on a focal surface, the posterior surface other than the focal surface, which secondary radiation is emitted from the focal surface as a reflected wavefront of radiation that passes through the optical system; directing means for directing the reflected wavefront onto a wavefront analyzer; and a wavefront analyzer for measuring distortions associated with the reflected wavefront.
2 . The apparatus recited in claim 1 , wherein the focusing means comprises a long-focal-length lens for converging the optical beam through a small angle and focusing the optical beam on the anterior surface.
3 . The apparatus recited in claim 2 , wherein the long-focal-length lens has a focal length of at least one-half meter.
4 . The apparatus recited in claim 1 , wherein the focusing means comprises a zoom lens for converging the optical beam through a small angle and varying the focusing of the optical beam onto various anterior surfaces.
5 . The apparatus recited in claim 1 , further comprising a laser for providing the optical beam.
6 . The apparatus recited in claim 1 , further comprising the a shutter operable from a closed position to an open position for controlling an amount of optical beam energy delivered to the optical system.
7 . The apparatus recited in claim 1 , wherein the wavefront analyzer comprises:
an opaque plate having an aperture therein for transmitting a portion of the emitted wavefront therethrough; and a light-sensitive material downstream of and in spaced relation to the opaque plate for receiving the portion of the reflected wavefront projected as a finite image thereon.
8 . The apparatus recited in claim 7 , wherein the aperture comprises an aperture array and wherein the light-sensitive material comprises a CCD array.
9 . The apparatus recited in claim 8 , further comprising a lens carried within each of the plurality of apertures of the aperture array.
10 . The apparatus recited in claim 1 , further comprising polarizing means for polarizing the optical beam.
11 . The apparatus recited in claim 10 , further comprising a polarization beamsplitter for reflecting an S-component of the reflected wavefront and for transmitting a P-component of the reflected wavefront as a polarized wavefront therethrough.
12 . The apparatus recited in claim 1 , further comprising a camera positioned for viewing the focal surface.
13 . An apparatus for measuring vision characteristics of an eye, the apparatus comprising:
a laser for providing an optical beam; focusing means for focusing the optical beam behind a retina of the eye for providing a finite source of secondary radiation on the retina of the eye, which secondary radiation is emitted from the retina as a reflected wavefront of radiation that passes outward from the eye; polarizing means placed within a path of the optical beam for transmitting a polarized wavefront therethrough; and a wavefront analyzer receiving the polarized wavefront for measuring distortions associated therewith.
14 . The apparatus recited in claim 13 , wherein the focusing means comprises a long-focal-length lens for converging the optical beam through a small angle and focusing the optical beam on the anterior surface.
15 . The apparatus recited in claim 14 , wherein the long-focal-length lens has a 15 focal length of approximately one-half meter.
16 . The apparatus recited in claim 13 , further comprising the a shutter operable from a closed position to an open position for controlling an amount of optical beam energy delivered to the eye.
17 . The apparatus recited in claim 13 , wherein the wavefront analyzer comprises:
an opaque plate having an aperture therein for transmitting a portion of the emitted wavefront therethrough; and a light-sensitive material downstream of and in spaced relation to the opaque plate for receiving the portion of the reflected wavefront projected as a finite image thereon.
18 . The apparatus recited in claim 17 , wherein the aperture comprises an aperture array and wherein the light-sensitive material comprises a CCD array.
19 . The apparatus recited in claim 18 , further comprising a lens carried within each aperture of the aperture array.
20 . The apparatus recited in claim 13 , further comprising a fixation target for viewing by a patient whose eye is being measured, the fixation target assuring that a patient whose eye is being measured is looking along a preferred direction.
21 . The apparatus recited in claim 13 , further comprising a camera positioned for viewing the focal surface.
22 . A method for measuring vision defects of an eye comprising the steps of:
focusing an optical beam anterior of the retina of the eye, but not on the retina, for placing a finite source of secondary radiation on the retina, which secondary radiation is emitted from the retina as a reflected wavefront of radiation that passes through the eye; projecting the reflected wavefront onto a wavefront analyzer; and measuring distortions associated with the reflected wavefront.Join the waitlist — get patent alerts
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