Apparatus and methods for slurry flow control
Abstract
Apparatus and methods are disclosed for controlling slurry flow in a chemical mechanical polishing apparatus for planarizing an object to be polished by supplying slurry on a grinding pad through a slurry injection nozzle. A disclosed apparatus includes a slurry supply unit; a photo image sensor mounted to one side of a by-pass; a slurry measuring unit for analyzing an image captured by the photo image sensor to measure the sizes of particles and the density of the slurry; and a slurry flow control unit. The disclosed apparatus and methods perform real-time flow control of slurry fed to the injection nozzle through the slurry supply line.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . An apparatus to control slurry flow in a chemical mechanical polishing apparatus for planarizing an object to be polished by supplying slurry on a grinding pad through a slurry injection nozzle, the apparatus comprising:
a slurry supply unit to supply slurry to the slurry injection nozzle through a slurry supply line; a photo image sensor to detect a generally cross-sectional image of the slurry flowing in a by-pass diverged from the slurry supply line; a slurry measuring unit to analyze the image captured by the photo image sensor to measure the sizes of particles included in the slurry and the density of the slurry; and a slurry flow control unit to control the slurry supply unit based upon the particle sizes and the slurry density measured by the slurry measuring unit.
2 . An apparatus to control slurry flow in a chemical mechanical polishing apparatus for planarizing an object to be polished by supplying slurry on a grinding pad through a slurry injection nozzle, the apparatus comprising:
a slurry supply unit to supply slurry to the slurry injection nozzle through a slurry supply line; a photo image sensor to detect a generally cross-sectional image of the slurry flowing in a by-pass diverged from the slurry supply line; a slurry measuring unit to analyze the image captured by the photo image sensor to measure the sizes of particles included in the slurry and the density of the slurry; a diluent solution supply unit to supply diluent solution into the by-pass to reduce a concentration of particles in the slurry; and a slurry flow control unit to control the slurry supply unit based upon the particle sizes and the slurry density measured by the slurry measuring unit.
3 . An apparatus as defined in claim 2 , wherein the diluent solution is pure water or a solution with the same composition as the slurry solution.
4 . A method to control slurry flow in a chemical mechanical polishing apparatus for planarizing an object to be polished by supplying slurry on a grinding pad through a slurry injection nozzle, the method comprising:
supplying slurry to the slurry injection nozzle through a slurry supply line; introducing slurry into a by-pass diverged from the slurry supply line; capturing a cross-sectional image of the by-pass to measure the sizes of particles included in the slurry and the density of the slurry; and controlling supply of the slurry based upon the measured sizes of particles and density of slurry.
5 . A method to control slurry flow in a chemical mechanical polishing apparatus for planarizing an object to be polished by supplying slurry on a grinding pad through a slurry injection nozzle, the method comprising:
supplying slurry to the slurry injection nozzle through a slurry supply line; introducing slurry into a by-pass diverged from the slurry supply line; supplying a diluent solution into the by-pass to reduce a concentration of particles of the slurry; capturing a cross-sectional image of the by-pass to measure the sizes of particles included in the slurry and the density of the slurry; and controlling supply of the slurry based upon the measured sizes of particles and density of slurry.
6 . A method as defined in claim 5 , wherein the diluent solution is pure water or a solution with the same composition as the slurry solution.
7 . A method as defined in claim 5 , wherein the density of the slurry is calculated to be higher in proportion to an amount of supplied diluent solution.
8 . A method as defined in claim 5 , wherein an amount of the particles is calculated to be higher in proportion to an amount of supplied diluent solution.
9 . A method as defined in claim 5 , wherein the density of the slurry is calculated to be higher in inverse proportion to the amount of supplied slurry.
10 . A method as defined in claim 5 , wherein an amount of the particles is calculated to be higher in inverse proportion to the amount of supplied slurry.Join the waitlist — get patent alerts
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