Method and system for post-treating dry-etched metal film
Abstract
A method for post-treating a dry-etched metal film is provided. The dry-etched metal film includes an unetched portion covered by a photoresist and an etched portion exposed from the photoresist and having thereon an etching by-product. According to the method, a stripping agent is used to remove the photoresist on the unetched portion, while reacting the stripping agent with the etching by-product to form a passivation layer on the exposed metal film. Then, a washing agent is used to remove the passivation layer after the photoresist is removed. A system for performing combined etching and stripping procedures of a metal film is also provided. The system comprises dry-etching chambers, stripping and cleaning chambers and a transportation device. In the stripping and cleaning chambers, the photoresist on the unetched portion is removed by a stripping agent and a passivation layer is formed on the etched portion by reacting the stripping agent.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A method for post-treating a dry-etched metal film, said dry-etched metal film comprising an unetched portion covered by a photoresist and an etched portion exposed from said photoresist and having thereon an etching by-product, said method comprising steps of:
using a stripping agent to remove said photoresist on said unetched portion, while reacting said stripping agent with said etching by-product to form a passivation layer on said exposed metal film; and using a washing agent to remove said passivation layer after said photoresist is removed.
2 . The method according to claim 1 wherein said metal film is an aluminum-based film.
3 . The method according to claim 2 wherein said aluminum-based film is made of a material selected from one of aluminum and aluminum alloy.
4 . The method according to claim 2 wherein said etching by-product is aluminum chloride (AlCl x ).
5 . The method according to claim 1 wherein said passivation layer is substantially non-reactive to water.
6 . The method according to claim 1 wherein said stripping agent is monoethanolamine (MEA).
7 . The method according to claim 6 wherein said washing agent is isopropyl alcohol (IPA), water or a combination thereof.
8 . The method according to claim 1 being substantially performed immediately after said dry-etched metal film is formed.
9 . The method according to claim 1 further comprising a primary treatment step before the step of said stripping step, wherein said primary treatment step is selected from a group consisting of carbon tetrafluoride/oxygen (CF 4 /O 2 ) plasma treatment, gaseous water/oxygen (H 2 O(g)/O 2 ) plasma treatment, hydrocarbonfluoride (C x H y F 2 ) deposition plasma treatment, ashing treatment and hot water rinse treatment.
10 . A method for dry etching a metal film, said method comprising steps of:
providing a substrate with a metal film thereon, said metal film having a first portion covered by a photoresist and a second portion uncovered by said photoresist; using a dry etchant to etch off said second portion; using a stripping agent to remove said photoresist on said first portion and simultaneously form a water-insoluble passivation layer on a third portion of said etched metal film exposed from said photoresist; and using a washing agent to wash off said water-insoluble passivation layer after said photoresist is removed.
11 . The method according to claim 10 wherein said metal film is made of one of aluminum and aluminum alloy.
12 . The method according to claim 11 wherein said dry etchant includes one of chlorine (Cl 2 ) and boron chloride (BCl 3 ), which reacts with aluminum to form water-soluble aluminum chloride (AlCl x ) on said third portion of said metal film, and said stripping agent reacts with aluminum chloride (AlCl x ) to form said water-insoluble passivation layer on said thrid portion of said metal film.
13 . The method according to claim 10 wherein said stripping agent is monoethanolamine (MEA), and said washing agent is isopropyl alcohol (IPA), water or a combination thereof.
14 The method according to claim 10 wherein said stripping step is substantially performed immediately after said dry etch step.
15 . The method according to claim 10 further comprising an initial treatment before the step of providing said stripping agent, and said initial treatment is selected from a group consisting of carbon tetrafluoride/oxgen (CF 4 /O 2 ) plasma treatment, gaseous water/oxygen (H 2 O(g)/O 2 ) plasma treatment, hydrocarbonfluoride (C x H y F 2 ) deposition plasma treatment, ashing treatment and hot water rinse treatment.
16 . A system for performing combined etching and stripping procedures of a metal film, said system comprising:
at least one dry-etching chambers where a substrate with a metal film is dry etched to form an unetched portion covered by a photoresist and an etched portion exposed from said photoresist; at least one stripping and cleaning chambers where said photoresist on said unetched portion is removed by a stripping agent and a passivation layer is formed on said etched portion by reacting said stripping agent; and a transportation device transferring said substrate between said at least one dry-etching chambers and said at least one stripping and cleaning chambers.
17 . The system according to claim 16 , wherein each of said at least one stripping and cleaning chambers comprises a spin stripper.
18 . The system according to claim 16 further comprising a load lock chamber and a transfer chamber between said at least one dry-etching chambers and said at least one stripping and cleaning chambers, and said transportation device transferring said substrate between said at least one dry-etching chambers and said at least one stripping and cleaning chambers through said load lock chamber and a transfer chamber.Join the waitlist — get patent alerts
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