US2004077294A1PendingUtilityA1
Method and apparatus to provide a GMR lapping plate texturization using a photo-chemical process
Priority: Oct 11, 2002Filed: Oct 10, 2003Published: Apr 22, 2004
Est. expiryOct 11, 2022(expired)· nominal 20-yr term from priority
B24D 18/00G11B 5/3116B24B 37/00
40
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Claims
Abstract
A system and method are described for manufacturing a lapping plate. In one example, the lapping plate is made by covering a Tin-Antimony plate with photoresist and exposing the resulting photoresist layer with UV light through a wire mesh mask. After development, the non-etch areas can serve as land areas for diamond charging. Such a method may lead to fewer artifacts on the lapping plate and smaller diamond particle dimensions resulting in better processing of read/write heads, especially GMR heads.
Claims
exact text as granted — not AI-modifiedWhat is claimed is:
1 . A method of manufacturing a lapping plate comprising:
selectively etching a metal plate; and imbedding diamond particles into said metal plate.
2 . The method of claim 1 wherein said etching step includes:
applying a photoresist layer to said metal plate; and
selectively removing photoresist from a surface of said metal plate.
3 . A method of manufacturing a lapping plate comprising:
applying a photoresist layer to a metal plate; selectively exposing areas of said photoresist layer to electromagnetic radiation; developing said photoresist layer; etching areas of said metal disk; and imbedding diamond particles into non-etched areas of said metal disk.
4 . The method of claim 3 wherein said selectively exposing operating includes:
providing a mask between an electromagnetic radiation source and said photoresist layer;
5 . The method of claim 4 wherein said mask is a wire mesh.
6 . The method of claim 4 wherein said electromagnetic radiation is ultra-violet radiation.
7 . The method of claim 4 wherein said photoresist is a positive photoresist.
8 . The method of claim 4 wherein said photoresist is a negative photoresist.
9 . The method of claim 4 wherein said etching operation is a wet-etch operation.
10 . The method of claim 4 wherein said diamond particles have a diameter less than 50 nanometers.
11 . A method of fabricating a read/write head for a disk drive, comprising:
applying a photoresist layer to a metal plate; selectively exposing areas of said photoresist layer to electromagnetic radiation; developing said photoresist layer; etching areas of said metal disk; imbedding diamond particles into non-etched areas of said metal disk to create a lapping plate; and lapping a read/write head with said lapping plate.
12 . The method of claim 11 wherein said selectively exposing operating includes:
providing a mask between an electromagnetic radiation source and said photoresist layer;
13 . The method of claim 12 wherein said mask is a wire mesh.
14 . The method of claim 12 wherein said electromagnetic radiation is ultra-violet radiation.
15 . The method of claim 12 wherein said photoresist is a positive photoresist.
16 . The method of claim 12 wherein said photoresist is a negative photoresist.
17 . The method of claim 12 wherein said etching operation is a wet-etch operation.
18 . The method of claim 12 wherein said diamond particles have a diameter less than 50 nanometers.
19 . The method of claim 18 wherein said read/write head is a GMR read/write head.
20 . The method of claim 18 wherein a pole tip recession for said GMR read/write head is between 2 and 3 nanometers.
21 . A lapping plate comprising:
a metal plate including a plurality of etched areas, said etched areas formed from an etching operation through a developed photoresist mask; and diamond particles imbedded into non-etched areas of the metal plate.
22 . The lapping plate of claim 21 wherein said photoresist is a positive photoresist.
23 . The lapping plate of claim 21 wherein said photoresist is a negative photoresist.
24 . The lapping plate of claim 21 wherein said metal plate is wet-etched.
25 . The lapping plate of claim 21 wherein said diamond particles have a diameter less than 50 nanometers.Join the waitlist — get patent alerts
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